Silicon nanocrystals from high‐temperature annealing: Characterization on device level

Authors: 

Philipp Löper, Mariaconcetta Canino, Julian López‐Vidrier, Manuel Schnabel, Florian Schindler, Friedemann Heinz, Anke Witzky, Michele Bellettato, Marco Allegrezza, Daniel Hiller, Andreas Hartel, Sebastian Gutsch, Sergi Hernández, Roberto Guerra, Stefano Ossicini, Blas Garrido, Stefan Janz, Margit Zacharias

Circular codes revisited: a statistical approach

Authors: 

DL Gonzalez, S Giannerini, R Rosa

Remarks on the room temperature impurity band conduction in heavily Al+ implanted 4H-SiC

Authors: 

A Parisini, M Gorni, A Nath, L Belsito, Mulpuri V Rao, R Nipoti

Nanomechanical characterization of zirconia thin films deposited on UHMWPE by pulsed plasma deposition

Authors: 

Michele Bianchi, Marco Boi, Nicola Lopomo, Maria Cristina Maltarello, Fabiola Liscio, Silvia Milita, Andrea Visani, Alessandro Russo, Maurilio Marcacci

Green and easily scalable microwave synthesis of noble metal nanosols (Au, Ag, Cu, Pd) usable as catalysts

Authors: 

M Blosi, S Albonetti, S Ortelli, AL Costa, L Ortolani, M Dondi

Continuous tuning of the mechanical sensitivity of Pentacene OTFTs on flexible substrates: From strain sensors to deformable transistors

Authors: 

Piero Cosseddu, G Tiddia, S Milita, Annalisa Bonfiglio

ECS Transactions

Authors: 

JA Van Den Berg, MA Reading, A Parisini, M Kolbe, B Beckhoff, S Ladas, M Fried, P Petrik, P Bailey, T Noakes, T Conard, S De Gendt

Cover Picture: Liquid‐Crystalline Rigid‐Core Semiconductor Oligothiophenes: Influence of Molecular Structure on Phase Behaviour and Thin‐Film Properties (Chem. Eur. J. 36/2007)

Authors: 

Manuela Melucci, Laura Favaretto, Christian Bettini, Massimo Gazzano, Nadia Camaioni, Piera Maccagnani, Paolo Ostoja, Magda Monari, Giovanna Barbarella

Quantification of nuclear damage in high energy ion implanted lithium niobate

Authors: 

M Bianconi, N Argiolas, M Bazzan, GG Bentini, A Cerutti, M Chiarini, G Pennestrì, P Mazzoldi, C Sada

Direct detection of DNA sequences based on capacitance measurements through a configurable mixed-signal architecture

Authors: 

Lucia Bissi, Pisana Placidi, Michele Cicioni, Andrea Scorzoni, Fulvio Mancarella, Stefano Zampolli

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