Charge Transfer and Percolation in C60/Pentacene Field‐Effect Transistors

Authors: 

Adrica Kyndiah, Tobias Cramer, Cristiano Albonetti, Fabiola Liscio, Stefano Chiodini, Mauro Murgia, Fabio Biscarini

The scattering approach: Application to the conductance of silicon nanograins

Authors: 

AM Mazzone, V Morandi

WAFER-LEVEL MEASUREMENT OF THIN FILMS THERMOELECTRIC POWER

Authors: 

A RONCAGLIA, F MANCARELLA, GC CARDINALI, S CRISTIANI, M SANMARTIN, M SEVERI

Structural analysis and depth profiling of nanometric SiO2/SRO multilayers

Authors: 

Mario Barozzi, Salvatore Gennaro, Massimo Bersani, L Vanzetti, Yoann Jestin, Georg Pucker, S Milita, R Balboni

SELECTIVE MONITORING OF INDOOR VOC AT PPB LEVEL

Authors: 

S ZAMPOLLI, I ELMI, S NICOLETTI, L DORI, GC CARDINALI, J STÜRMANN

Raman Amplifier Structure

Authors: 

Stefano Faralli, Gabriele Bolognini, Giovanni Sacchi, Fabrizio Di Pasquale

Monolithic silicon-based microthruster for orbital and attitude control fabricated by using MEMS technologies

Authors: 

Marco Chiarini, Paolo Cerabolini, Giuseppe Pennestri, Gian G Bentini, Roberto Cocomazzi, Annalisa Cerutti, Alessio Nubile

Transient Control in SOA-Based WDM Metro-Ring Networks Under Add–Drop Operation Using a Reservoir Channel

Authors: 

Tomasz Rogowski, Stefano Faralli, Gabriele Bolognini, Fabrizio Di Pasquale, Rodolfo Di Muro, Bimal Nayar

Micromachined gas calibration sources based on nanometric depth microchannels

Authors: 

S Zampolli, I Elmi, F Mancarella, M Messina, G Marra, E Cozzani, M Belluce, F Tamarri, M Sanmartin, GC Cardinali, M Severi

Planar silicon SPADs with 200-μm diameter and 35-ps photon timing resolution

Authors: 

Massimo Ghioni, Angelo Gulinatti, Piera Maccagnani, Ivan Rech, Sergio Cova

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