Stacking faults evolution during epitaxial growths: Role of surface the kinetics

Authors: 

Massimo Camarda, Antonino La Magna, Andrea Canino, Francesco La Via

Performance enhancement in ultra-scaled SONOS FinFlash by inclusion of high-k dielectric in the gate stack

Authors: 

C Jahan, E Nowak, L Perniola, M Gely, G Molas, S Lombardo, B De Salvo, S Deleonibus

Oxide TFT Stability

Authors: 

Guglielmo Fortunato

Quantitative electron energy loss spectroscopy of Si nanoclusters embedded in SiO x

Authors: 

G Nicotra, C Bongiorno, L Caristia, S Coffa, C Spinella

Binary and complex oxide thin films for microelectronic applications: An insight into their growth and advanced nanoscopic investigation

Authors: 

Raffaella Lo Nigro, Patrick Fiorenza, Maria R Catalano, Gabriele Fisichella, Fabrizio Roccaforte, Graziella Malandrino

Perovskite CaCu 3 Ti 4 O 12 thin films for capacitive applications: From the growth to the nanoscopic imaging of the permittivity

Authors: 

P Fiorenza, R Lo Nigro, A Sciuto, P Delugas, V Raineri, RG Toro, MR Catalano, G Malandrino

Evaluation of the degradation of floating-gate memories with Al2O3 tunnel oxide

Authors: 

J Buckley, G Molas, M Gély, F Martin, B De Salvo, S Deleonibus, G Pananakakis, C Bongiorno, S Lombardo

Maskless implants of 20 keV Ga+ in thin crystalline silicon on insulator

Authors: 

AM Mio, G D'Arrigo, RG Milazzo, E Rimini, C Spinella, L Peto, A Nadzeyka, S Bauerdick

A multi-objective clonal selection algorithm for analog circuit and solar cell design

Authors: 

Andrea Patane, Andrea Santoro, Giovanni Carapezza, Antonino La Magna, Vittorio Romano, Giuseppe Nicosia

Temperature and light induced effects on the capacitance of 4H-SiC Schottky photodiodes

Authors: 

Massimo Mazzillo, Antonella Sciuto, Giuseppe Catania, Fabrizio Roccaforte, Vito Raineri

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