A density functional theory study of epitaxial graphene on the (3× 3)-reconstructed C-face of SiC

Authors: 

I Deretzis, A La Magna

Papers presented at the E-MRS 2014 Spring Meeting–Symposium X Materials Research for Group IV Semiconductors: Growth, Characterization, and Technological Developments

Authors: 

Werner Schustereder, Johannes G Laven, Hans-Joachim Schulze, Peter Hadley, Sebastiano Ravesi, Filippo Giannazzo

Uniformity of Epitaxial Graphene on On-axis and Off-axis SiC Probed by Raman Spectroscopy and Nanoscale Current Mapping

Authors: 

Sushant Sonde, Filippo Giannazzo, Jean Roch Huntzinger, Antoine Tiberj, Mikael Syväjärvi, Rositza Yakimova, Vito Raineri, Jean Camassel

Low temperature epitaxial growth of SiGe absorber for thin film heterojunction solar cells

Authors: 

R Cariou, J Tang, N Ramay, R Ruggeri, P Roca i Cabarrocas

The influence of substrate on the properties of Er 2 O 3 films grown by magnetron sputtering

Authors: 

M Miritello, R Lo Savio, F Iacona, G Franzo, C Bongiorno, A Irrera, F Priolo

Heteroepitaxy of 3 C-SiC on different on-axis oriented silicon substrates

Authors: 

R Anzalone, A Severino, G D’arrigo, C Bongiorno, G Abbondanza, G Foti, S Saddow, F La Via

Homogeneity of Ge-rich nanostructures as characterized by chemical etching and transmission electron microscopy

Authors: 

Monica Bollani, Daniel Chrastina, Valeria Montuori, Daniela Terziotti, Emiliano Bonera, Giovanni M Vanacore, Alberto Tagliaferri, Roman Sordan, Corrado Spinella, Giuseppe Nicotra

Reliability of charge trapping memories with high-k control dielectrics

Authors: 

G Molas, Marc Bocquet, E Vianello, L Perniola, H Grampeix, JP Colonna, L Masarotto, F Martin, P Brianceau, M Gély, C Bongiorno, S Lombardo, G Pananakakis, G Ghibaudo, B De Salvo

From atomistic to device level investigation of hybrid redox molecular/silicon field-effect memory devices

Authors: 

Tiziana Pro, Julien Buckley, Régis Barattin, Adrian Calborean, Venera Aiello, Giuseppe Nicotra, Kai Huang, Marc Gély, Guillaume Delapierre, Eric Jalaguier, Florence Duclairoir, Nicolas Chevalier, Salvatore Lombardo, Pascale Maldivi, Gérard Ghibaudo, Barbara De Salvo, Simon Deleonibus

Reliability of Thin Thermally Grown SiO2 on 3C-SiC Studied by Scanning Probe Microscopy

Authors: 

Jens Eriksson, Ming Hung Weng, Fabrizio Roccaforte, Filippo Giannazzo, Patrick Fiorenza, Jean Lorenzzi, Gabriel Ferro, Vito Raineri

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