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Automatic Image Analysis of Stackingfault
Type:
Conference
Description:
Publisher:
Trans Tech Publications Ltd
Publication date:
1 Jan 2022
Authors:
Annamaria Muoio, Cristiano Calabretta, Viviana Scuderi, Massimo Zimbone, Francesco La Via
Biblio References:
Volume: 1062 Pages: 283-287
Origin:
Materials Science Forum
Link:
https://scholar.google.it/citations?view_op=view_citation&hl=en&citation_for_vie…
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