M Ferroni, PG Merli, V Morandi
Biblio references: Pages: 475-478
Origin: Microscopy of Semiconducting Materials
G Scarel, M Fanciulli
Biblio references: Pages: 31-38
Origin: Materials for Information Technology
S ZAMPOLLI, I ELMI, S NICOLETTI, L DORI, GC CARDINALI, J STÜRMANN
Biblio references: Pages: 356-363
Origin: Sensors And Microsystems
D Dello Monaco, C Distante, DS Presicce, P Siciliano, AM Taurino, M Zuppa, A CIMATO, G SANI
Biblio references: Pages: 128-133
G DI FRANCIA, I REA, P MADDALENA, S LETTIERI
Biblio references: Pages: 159-163
L FRANCIOSO, A FORLEO, P SICILIANO, AM TAURINO, M STALDER, R NESPER
Biblio references: Pages: 164-168
E MASSERA, I NASTI, L QUERCIA, I REA, G DI FRANCIA
Biblio references: Pages: 139-144
Andrea Adami, A Benvenuto, Leandro Lorenzelli, Mario Zen, L Francioso, P Siciliano
Biblio references: Pages: 364-368
A FORLEO, M EPIFANI, R RELLA, P SICILIANO, AM TAURINO, A D’AMICO, C DI NATALE, D MONTI, S NARDIS, R PAOLESSE
Biblio references: Pages: 86-91
and Viviana Mulloni Flavio Giacomozzi, Marco Bellei, Paola Farinelli
Biblio references: Volume: 7 Pages: 54-62
Origin: Advanced MEMS for RF and Millimeter Wave Communications, Series in Micro and Nanoengineering
