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Low temperature CEMS of Sn-implanted SiO 2

R Mantovan, S Spiga, M Fanciulli

2006-01-01

Biblio references: Pages: 69-73

Origin: ICAME 2005
Annealing effects on p+ n junction 4H-SiC diodes after very high neutron irradiation

F Moscatelli, Andrea Scorzoni, A Poggi, M Bruzzi, S Sciortino, S Lagomarsino, R Nipoti

2006-01-01

Biblio references:

Origin: Radiation Effects On Components And Systems RADECS 2006 Workshop

Pages