Electrical Characterization of Ultra-Thin Silicon-on-Insulator Films Doped By Means of Phosphorus End-Terminated Polymers | IMM Container

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Electrical Characterization of Ultra-Thin Silicon-on-Insulator Films Doped By Means of Phosphorus End-Terminated Polymers

Type:

Journal

Description:

Publisher:

The Electrochemical Society, Inc.

Publication date:

22 Dec 2023

Authors:

Andrea Pulici, Stefano Kuschlan, Gabriele Seguini, Fabiana Taglietti, Marco Fanciulli, Riccardo Chiarcos, Michele Laus, Michele Perego

Biblio References:

Issue: 30 Pages: 1552-1552

Origin:

Electrochemical Society Meeting Abstracts 244

Link:

https://scholar.google.it/citations?view_op=view_citation&hl=en&citation_for_vie…