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Electrical Scanning Probe Microscopy Investigation of Schottky and Metal-Oxide Junctions on Hetero-Epitaxial 3C-SiС on Silicon

Type: 
Conference
Description: 
Publisher: 
Trans Tech Publications Ltd
Publication date: 
1 Jan 2022
Authors: 

Filippo Giannazzo, Patrick Fiorenza, E Schiliro, Salvatore Di Franco, Sylvain Monnoye, Hugues Mank, Marcin Zielinski, Francesco La Via, Fabrizio Roccaforte

Biblio References: 
Volume: 1062 Pages: 400-405
Origin: 
Materials Science Forum
Link: 
https://scholar.google.it/citations?view_op=view_citation&hl=en&citation_for_vie…

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