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Type: 
Journal
Description: 
Subject: 36 MATERIALS SCIENCE; ATOMIC FORCE MICROSCOPY; DOMAIN STRUCTURE; ELECTRON DIFFRACTION; FERROMAGNETIC MATERIALS; FERROMAGNETIC RESONANCE; FERROMAGNETISM; GALLIUM NITRIDES; INTERFACES; IRON; MAGNETIC PROPERTIES; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR MATERIALS; SURFACE PROPERTIES; SURFACES; X-RAY DIFFRACTION
Publisher: 
Publication date: 
1 Jul 2005
Authors: 

R Meijers, R Calarco, H Lueth, M Buchmeier, D Buergler

Biblio References: 
Volume: 40
Origin: 
Verhandlungen der Deutschen Physikalischen Gesellschaft