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Type: 
Conference
Description: 
Publisher: 
IEEE
Publication date: 
3 Jul 2017
Authors: 

Manuel Escudero-Lopez, Francesc Moll, Antonio Rubio, Ioannis Vourkas

Biblio References: 
Pages: 120-125
Origin: 
2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)