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Type: 
Journal
Description: 
Publisher's Note: “Nanoscale study of the current transport through transrotational NiSi/n-Si contacts by conductive atomic force microscopy” [Appl. Phys. Lett. 101, 261906 (2012)] ... Citation: Appl. Phys. Lett. 102, 039901 (2013); doi: 10.1063/1.4789899 View online: http://dx.doi.org/10.1063 /1.4789899 View Table of Contents: http://apl.aip.org/resource/1/APPLAB/v102/i3 Published by the AIP Publishing LLC. ... Journal Homepage: http://apl.aip.org/ Journal Information: http://apl.aip.org/about/about_the_journal Top downloads: http://apl.aip.org/features/ ...
Publisher: 
AIP Publishing
Publication date: 
21 Jan 2013
Biblio References: 
Volume: 102 Issue: 3 Pages: 039901-039901.1
Origin: 
Applied Physics Letters