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Type: 
Book
Description: 
Raman scattering is an inelastic light scattering non-destructive technique which allows the access mainly to the phonon modes at the Г point of materials and in some cases to the dispersion (Goni AR et al., 2001; Zunke et al., 1995; Weinstein et al., 1975). Since its discovery, Raman has been used both for the characterization of materials and for the understanding of basic interactions such as plasmonic excitations (Raman et al., 1928; Szymanski HA et al., 1967; Otto et al., 1992; Schuller et al., 1996; Steinbach et al., 1996; Ulrichs et al., 1997, Sood et al 1985, Abstreiter et al. 1979, Roca et al. 1994, Pinczuk et al 1977, Pinczuk et al., 1979). Raman spectroscopy can be experimentally performed at the nanoscale by using a confocal microscope or even a tip enhanced scanning microscope. It is possible to obtain lateral submicron resolutions of the properties of a material (Hartschuh et al., 2003). Nowadays Raman spectroscopy is a versatile and relative standard tool for the characterization of materials giving detailed information on crystal structure, phonon dispersion, electronic states, composition, strain and so-on bulk materials, thin film and nanostructures (Cardona, 1982; Anastassakis, 1997; Reithmaier et al., 1990; Spitzer et al., 1994; Pinczuk et al., 1977; Pinczuk et al., 1979; Baumgartner et al., 1984; Schuller et al., 1996; Pauzauskie et al., 2005; Long, 1979).In the last decade Raman spectroscopy has been increasingly used to study nanowires and quantum dots (Abstreiter et al., 1996; Roca et al., 1994). Several new phenomena have been reported to date with respect to one-dimensional structures. For example, the high surfaceto-volume …
Publisher: 
InTech
Publication date: 
1 Feb 2010
Authors: 

Ilaria Zardo, Gerhard Abstreiter, Anna Fontcuberta i Morral

Biblio References: 
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