Graphene has attracted a lot of interest for fundamental studies as well as for potential applications. Various techniques have been developed to produce graphene and recently the growth of large area graphene by Catalytic Chemical Vapor Deposition (C-CVD) has occupied a relevant role. In this work, Raman spectroscopy and Scanning Electron Microscopy (SEM) measurements are carried out on graphene films grown on thin Ni and Cu catalyst films by CVD at atmospheric pressure. The complementary Raman and SEM characterization shows that films grown on Ni are multilayers, while very thin graphene flakes (from 1-to 3-layer) are grown on Cu.