Reliability and Power Handling Issues in Ohmic Series and Shunt Capacitive RF MEMS Switches for Space Applications | IMM Container

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Reliability and Power Handling Issues in Ohmic Series and Shunt Capacitive RF MEMS Switches for Space Applications

Type:

Book

Description:

Publisher:

Editura Academiei Române, Bucureşti, Romania

Publication date:

1 Jan 2007

Authors:

Larissa Vietzorreck Simone Catoni, Sergio Di Nardo, Paola Farinelli

Biblio References:

Volume: 10 Pages: 95-102

Origin:

Emerging Technologies for RF and Millimeter Waves Circuits, Series in Micro and Nanoengineering

Link:

https://scholar.google.it/citations?view_op=view_citation&hl=en&citation_for_vie…