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Type: 
Journal
Description: 
Structural properties of tetracene thin films grown by vacuum sublimation on a flexible Mylar© substrate have been investigated by means of synchrotron X-ray diffraction. The films are polycrystalline and are made up of crystalline domains oriented with the (0 0 l) planes almost parallel to the substrate and completely misoriented around the surface normal. Two crystallographic phases (α and β thin film phases) have been identified. They differ for the dh k l interplanar spacing, both larger than that of the bulk. As a comparison, results from tetracene films grown on SiO2 have been reported to investigate the different charge transport properties of films grown on Mylar and on SiO2 substrates.
Publisher: 
North-Holland
Publication date: 
15 Sep 2006
Authors: 

S Milita, C Santato, F Cicoira

Biblio References: 
Volume: 252 Issue: 22 Pages: 8022-8027
Origin: 
Applied surface science