Type:
Journal
Description:
The thermal resistance along the thickness of In 3 SbTe 2 crystalline nanowires was measured using the scanning thermal microscopy in 3ω mode. The nanowires were grown by metal organic vapor deposition, exploiting the VLS mechanism induced by Au metal-catalyst nanoparticles and harvested on a SiO 2/Si substrate. Two nanowires with different thickness (13 and 23 nm) were investigated. The thermal resistance of the nanowires was determined using two different approaches; the first one exploits the experimental data, ...
Publisher:
Publication date:
1 May 2017
Biblio References:
Volume: 214 Issue: 5
Origin:
physica status solidi (a)