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Type: 
Journal
Description: 
The thermal resistance along the thickness of In 3 SbTe 2 crystalline nanowires was measured using the scanning thermal microscopy in 3ω mode. The nanowires were grown by metal organic vapor deposition, exploiting the VLS mechanism induced by Au metal-catalyst nanoparticles and harvested on a SiO 2/Si substrate. Two nanowires with different thickness (13 and 23 nm) were investigated. The thermal resistance of the nanowires was determined using two different approaches; the first one exploits the experimental data, ...
Publisher: 
Publication date: 
1 May 2017
Authors: 

J‐L Battaglia, A Saci, I De, R Cecchini, S Selmo, M Fanciulli, S Cecchi, M Longo

Biblio References: 
Volume: 214 Issue: 5
Origin: 
physica status solidi (a)