The manufacture of bipolar junctions is necessary in many 4H-SiC electronic devices, eg, junction termination extensions and p+ in diodes for voltage class> 10 kV. However, the presence of electrically active levels in the drift layer that act as minority charge carrier lifetime killers, like the carbon vacancy (V C⁠), undermines device performance. In the present study, we compared p+ n diodes whose anodes have been manufactured by three different methods: by epitaxial growth, ion implantation, or plasma immersion ion implantation (PIII). The identification of the electrically active defects in the drift layers of these devices revealed that a substantial concentration of V C is present in the diodes with epitaxial grown or ion implanted anode. On the other hand, no presence of V C could be detected when the anode is formed by PIII and this is attributed to the effects of strain in the anode region. Our investigation shows …