4H-SiC Defects Analysis by Micro Raman Spectroscopy

Authors: 

Nicolo’ Piluso, Massimo Camarda, Ruggero Anzalone, Francesco La Via

WIDE BANDGAP HIGH-DENSITY SEMICONDUCTOR SWITCHING DEVICE AND MANUFACTURING PROCESS THEREOF

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Mario Giuseppe Saggio, Simone Rascuna, Fabrizio Roccaforte, Saggio, Mario Giuseppe

A single photon avalanche detector: SPAD

Authors: 

S Tudisco, S Privitera, F Musumeci, L Lanzanò, A Scordino, A Campisi, L Cosentino, G Condorelli, P Finocchiaro, S Lombardo, M Mazzillo, E Sciacca

Electrical properties of high energy ion irradiated 4 H-SiC Schottky diodes

Authors: 

G Izzo, G Litrico, L Calcagno, G Foti, F La Via

Screening length and quantum capacitance in graphene by scanning probe microscopy

Authors: 

F Giannazzo, S Sonde, V Raineri, E Rimini

Diffusion and Activation of Ultra Shallow Boron Implants in Silicon in Proximity of Voids

Authors: 

O Marcelot, A Claverie, Daniel Alquier, Frédéric Cayrel, Wilfried Lerch, Silke Paul, L Rubin, Vito Raineri, Filippo Giannazzo, H Jaouen

Strauctural properties of Si nanocrystals: implications for light emitting devices fabrication

Authors: 

A Irrera, G Franzo, M Miritello, R Lo Savio, S Boninelli, F Priolo, F Iacona, G Nicotra, C Bongiorno, C Spinella, S Coffa

Durbin, SM, 136

Authors: 

CD Breach, C Bunel, M Camalleri, D Canaperi, S Chakraborty, DSH Chan, HY Chan, L Chan, M Chan, YC Chan, N Chandani, S Chattopadhyay, BL Chen, Q Chen, ST Chen, TP Chen, XF Chen, XT Chen, Z Chen, L Cheng, YH Cheng, D Chevrie, HB Chew, YC Ee, F El Kamel, HJ Engelmann, BB Faizhal, LH Fen, HH Feng, Y Feng, V Filip, EA Fitzgerald, PD Foo, YL Foo, G Fortunato, T Fric, Z Gan, ZH Gan, D Gao, F Gao, W Gao, LM Gignac, CF Goh, IS Goh, MM Islam, MK Iyer, HM Jin, LJ Jin, F Jomni, YC Joo, JH Jun, JS Juneja, JY Jung, SB Jung, S Kaldor, S Kar, T Karabacak, ALAM Kemmeren, T Kheng Lee, GY Khoo, DG Kim, JW Kim, KS Kim, NH Kim, NS Kim, YS Kim, KY Lee, P Lee, PS Lee, RTP Lee, SB Lee, SJ Lee, TK Lee, WS Lee, C Li, CY Li, GY Li, H Li, MF Li, Q Li, R Li, S Li, WH Li, Z Li, EB Liao, SL Liew, B Lim, HS Lim, H Lin, J Lin, TT Lin, E Liniger

Film morphology and process conditions in epitaxial silicon carbide growth via chlorides route

Authors: 

Maurizio Masi, Alessandro Veneroni, ALESSANDRO Fiorucci, Francesco La Via, Gaetano Foti, Marco Mauceri, Stefano Leone, Giuseppe Pistone, Giuseppe Condorelli, Giuseppe Abbondanza, Gian Luca Valente, Danilo Crippa

Array of mutually insulated Geiger-mode avalanche photodiodes, and corresponding manufacturing process

Authors: 

Delfo Nunziato Sanfilippo, Emilio Antonio Sciacca, Piero Giorgio Fallica, Salvatore Antonio Lombardo, , Salvatore Antonio Lombardo

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