Effects of epitaxial layer growth parameters on the defect density and on the electrical characteristics of Schottky diodes

Authors: 

Francesco La Via, Fabrizio Roccaforte, Salvatore di Franco, Alfonso Ruggiero, L Neri, Ricardo Reitano, Lucia Calcagno, Gaetano Foti, Marco Mauceri, Stefano Leone, Giuseppe Pistone, Giuseppe Abbondanza, Gian Luca Valente, Danilo Crippa

Oxygen Functionalities Evolution in Thermally Treated Graphene Oxide Featured by EELS and DFT Calculations

Authors: 

D D’Angelo, C Bongiorno, M Amato, I Deretzis, A La Magna, E Fazio, S Scalese

Papers from the Eighth International Workshop on the Fabrication, Characterization, and Modeling of Ultra-shallow Doping Profiles in Semiconductors-Modeling Dopants and Defects-Size effects on

Authors: 

F Giannazzo, V Raineri, E Bruno, S Mirabella, G Impellizzeri, F Priolo, E Napolitani

From PbI2 to MAPbI3 through Layered Intermediates

Authors: 

Giovanna Pellegrino, Stefania D’Angelo, Ioannis Deretzis, Guglielmo Guido Condorelli, Emanuele Smecca, Graziella Malandrino, Antonino La Magna, Alessandra Alberti

3C-SiC heteroepitaxial growth on inverted silicon pyramids (ISP)

Authors: 

Giuseppe D'Arrigo, Andrea Severino, G Milazzo, Corrado Bongiorno, Nicolò Piluso, Giuseppe Abbondanza, Marco Mauceri, Giuseppe Condorelli, Francesco La Via

Materials and processing issues for the manufacturing of integrated passive and active devices on flexible substrates

Authors: 

S Ravesi, S Alessandrino, A Bassi, B Cafra, M Camalleri, L Caristia, S Coffa, S Di Marco, M Di Stefano, G Fortunato, S Lo Verso, F Mangano, A Pecora, Bg Pignataro, V Privitera, S Scalese, A Scandurra, N Sparta

Microscopic study of electrical properties of CrSi 2 nanocrystals in silicon

Authors: 

László Dózsa, Štefan Lányi, Vito Raineri, Filippo Giannazzo, Nikolay Gennadevich Galkin

Strain field analysis of 3C-SiC free-standing microstructures by micro-Raman and theoretical modelling

Authors: 

Massimo Camarda, Nicolò Piluso, Ruggero Anzalone, Antonino La Magna, Francesco La Via

Structural transformations in Ge2Sb2Te5 under high pressure and temperature

Authors: 

AM Mio, S Privitera, G D'Arrigo, M Ceppatelli, F Gorelli, M Santoro, M Miritello, R Bini, E Rimini

Single Shockley faults evolution under UV optical pumping

Authors: 

Andrea Canino, Massimo Camarda, Antonino La Magna, Francesco La Via

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