Electrical Properties of Inhomogeneous Pt/GaN Schottky Barrier

Authors: 

Fabrizio Roccaforte, Ferdinando Iucolano, Filippo Giannazzo, Salvatore di Franco, Valeria Puglisi, Vito Raineri

Impact of Morphological Features on the Dielectric Breakdown at SiO 2/3 C‐SiC Interfaces

Authors: 

Jens Eriksson, Fabrizio Roccaforte, Ming‐Hung Weng, Jean Lorenzzi, Nikoletta Jegenyes, Filippo Giannazzo, Patrick Fiorenza, Vito Raineri

Effects of annealing temperature on the degree of inhomogeneity of nickel-silicide/SiC Schottky barrier

Authors: 

L Calcagno, A Ruggiero, F Roccaforte, F La Via

Micro-and Nano-Scale Electrical Characterization of Epitaxial Graphene on Off-Axis 4H-SiC (0001)

Authors: 

Filippo Giannazzo, Corrado Bongiorno, Salvatore di Franco, Emanuele Rimini, Vito Raineri

Local order around Er3+ ions in thin silicon oxide layers grown in Si by MBE

Authors: 

F d'Acapito, S Mobilio, A Terrasi, S Scalese, G Franzó, F Priolo

Ion irradiation of AZO thin films for flexible electronics

Authors: 

Stefano Boscarino, Giacomo Torrisi, Isodiana Crupi, Alessandra Alberti, Salvatore Mirabella, Francesco Ruffino, Antonio Terrasi

Oxygen behavior in germanium during melting laser thermal annealing

Authors: 

R Milazzo, G Impellizzeri, M Cuscunà, D De Salvador, M Mastromatteo, A La Magna, G Fortunato, F Priolo, V Privitera, A Carnera, E Napolitani

Electrical Characterization of Al Implanted 4H-SiC Layers by Four Point Probe and Scanning Capacitance Microscopy

Authors: 

Filippo Giannazzo, Martin Rambach, Dario Salinas, Fabrizio Roccaforte, Vito Raineri

A novel approach to characterization of progressive breakdown in high-k/metal gate stacks

Authors: 

R Pagano, Salvatore Lombardo, Felix Palumbo, Paul Kirsch, SA Krishnan, C Young, Rino Choi, Gennadi Bersuker, James H Stathis

Epitaxial Growth on 150 mm 2° off Wafers

Authors: 

Francesco La Via, Nicolo’ Piluso, Patrick Fiorenza, Marco Mauceri, Carmelo Vecchio, Antonino Pecora, Danilo Crippa

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