Silicon resonant cavity enhanced photodetectors at 1.55 μm

Authors: 

M Casalino, L Sirleto, L Moretti, D Panzera, S Libertino, I Rendina

Degradation mechanisms in CMOS power amplifiers subject to radio-frequency stress and comparison to the DC case

Authors: 

Calogero D Presti, Francesco Carrara, Antonino Scuderi, Salvatore Lombardo, Giuseppe Palmisano

Conductive filament structure in HfO 2 resistive switching memory devices

Authors: 

S Privitera, G Bersuker, S Lombardo, C Bongiorno, DC Gilmer

Laser plasma monitored by silicon carbide detectors

Authors: 

L Calcagno, P Musumeci, M Zimbone, F La Via

Evolution of the Transrotational Structure During Crystallization of Amorphous Ge 2 Sb 2 Te 5 Thin Films

Authors: 

Emanuele Rimini, Riccardo De Bastiani, Egidio Carria, Maria Grazia Grimaldi, Giuseppe Nicotra, Corrado Bongiorno, Corrado Spinella

Nanoscale probing of the lateral homogeneity of donors concentration in nitridated SiO2/4H–SiC interfaces

Authors: 

Patrick Fiorenza, Salvatore Di Franco, Filippo Giannazzo, Fabrizio Roccaforte

Electrical properties of the graphene/4 H-SiC (0001) interface probed by scanning current spectroscopy

Authors: 

S Sonde, F Giannazzo, V Raineri, Rositsa Yakimova, J-R Huntzinger, Antoine Tiberj, Jean Camassel

Photochemical synthesis of copper nanoparticles incorporated in poly (vinyl pyrrolidone)

Authors: 

Salvatore Giuffrida, Lucia L Costanzo, Giorgio Ventimiglia, Corrado Bongiorno

Microstructure and Temperature Dependent Electrical Characteristics of Ohmic Contacts to AlGaN/GaN Heterostructures

Authors: 

Giuseppe Greco, Ferdinando Iucolano, Fabrizio Roccaforte

Absorption edges of black phosphorus: A comparative analysis

Authors: 

G Nicotra, A Politano, AM Mio, I Deretzis, J Hu, ZQ Mao, J Wei, A La Magna, C Spinella

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