Fe films of different thicknesses were deposited on wurtzite GaN (0 0 0 1) layers by electron beam evaporation. They were studied by a number of characterization techniques such as low-energy electron diffraction (LEED), X-ray diffraction (XRD), atomic force microscopy (AFM), Rutherford backscattering spectrometry (RBS), and ferromagnetic resonance (FMR). Despite the large lattice mismatch between Fe and wurtzite GaN a clear epitaxial relation was determined. Three distinct Fe domain orientations were found rotated by 120∘ relative to each other. Due to the formation of crystalline domains a hexagonal in-plane magnetic anisotropy was observed.
1 Oct 2005
Volume: 283 Issue: 3-4 Pages: 500-507
Journal of crystal growth