Type:
Book
Description:
In the last few years the STEM technique in standard SEMs has become a complementary approach to HAADF-STEM at high energy [1, 4], at least when high resolution is not required, as demonstrated by the availability of STEM attachments for all the commercial SEMs.
Publisher:
Springer, Berlin, Heidelberg
Publication date:
1 Jan 2008
Biblio References:
Pages: 581-582
Origin:
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany