GdSr2RuCu2O8 oriented thin films were prepared by dc sputtering. The films deposited between 870 and 900° C exhibited c-axis oriented GdSr2RuCu2O8 phase after an appropriate ex situ thermal treatment in oxygen atmosphere. X-ray diffraction (XRD), scanning electron microscopy (SEM) and energy dispersive spectrometry (EDS) were used to analyze the crystal structure, the surface morphology and the film composition, respectively. The investigations performed on the samples before and after oxygen …