A small post-accelerator has been used to measure the charge-state fractions of 0.125-0.50 MeV/amu He ions backscattered from silver films. The kinematics behavior of the backscattered ions is given by the well-known Rutherford Backscattering Spectrometry (RBS) Technique. In order to determine the film thickness at which the equilibrium film charge-state distribution occurs, we measured the charge state fractions for film thicknesses between 5.4 and 24.8 μg cm-2. Deconvolution analyses of the data reveal that the charge-states of He ions backscattered from Ag-films of thickness 14.8 μg cm-2, within the experimental errors, represent the equilibrium fractions. The experimental data at low energies appear to have three well-resolved peaks corresponding to the charge-state fractions of helium (He0, He+ and He++) while at higher energies only two peaks were detected corresponding to the charge-state fractions …