Radiation tolerance of NROM embedded products

Authors: 

Michael Lisiansky, Gil Cassuto, Yakov Roizin, Domenico Corso, Sebania Libertino, Antonio Marino, Salvatore A Lombardo, Isodiana Crupi, Calogero Pace, Felice Crupi, David Fuks, Arik Kiv, Ernesto Della Sala, Giuseppe Capuano, Felix Palumbo

Single Shockley faults enlargement during micro-photoluminescence defects mapping

Authors: 

Andrea Canino, Massimo Camarda, Francesco La Via

Full characterization of the loading of a magneto–optical trap from an alkali metal dispenser

Authors: 

S Bartalini, I Herrera, L Consolino, L Pappalardo, N Marino, G D'Arrigo, FS Cataliotti

Nanoscale probing of dielectric breakdown at SiO 2/3 C-SiC interfaces

Authors: 

Jens Eriksson, Fabrizio Roccaforte, Patrick Fiorenza, Ming-Hung Weng, Filippo Giannazzo, Jean Lorenzzi, Nikoletta Jegenyes, Gabriel Ferro, Vito Raineri

Nickel nanostructured materials from liquid phase photodeposition

Authors: 

Salvatore Giuffrida, Guglielmo G Condorelli, Lucia L Costanzo, Giorgio Ventimiglia, Raffaella Lo Nigro, Maria Favazza, Enrico Votrico, Corrado Bongiorno, Ignazio L Fragala

Photocatalytic properties of Nafion membranes containing graphene oxide/titania nanocomposites

Authors: 

D D'Angelo, S Filice, S Libertino, V Kosma, I Nicotera, V Privitera, S Scalese

Correlation between structural and sensing properties of carbon nanotube-based devices

Authors: 

S Baldo, S Scalese, V Scuderi, L Tripodi, A La Magna, L Romano, SG Leonardi, N Donato

Interfacial Disorder of Graphene Grown at High Temperatures on 4H-SiC (000-1)

Authors: 

Filippo Giannazzo, Giuseppe Nicotra, Ioannis Deretzis, Aurora Piazza, Gabriele Fisichella, S Agnello, Corrado Spinella, Antonino La Magna, Fabrizio Roccaforte, Rositza Yakimova

Onset of plastic relaxation in the growth of Ge on Si (001) at low temperatures: Atomic-scale microscopy and dislocation modeling

Authors: 

Anna Marzegalli, Matteo Brunetto, Marco Salvalaglio, Francesco Montalenti, Giuseppe Nicotra, Mario Scuderi, Corrado Spinella, Monica De Seta, Giovanni Capellini

From micro-to nanotransport properties in Pr 2 O 3-based thin layers

Authors: 

P Fiorenza, R Lo Nigro, V Raineri, S Lombardo, RG Toro, G Malandrino, IL Fragalà

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