In-situ monitoring by Raman spectroscopy of the thermal doping of graphene and MoS2 in O2-controlled atmosphere

Authors: 

Aurora Piazza, Filippo Giannazzo, Gianpiero Buscarino, Gabriele Fisichella, Antonino La Magna, Fabrizio Roccaforte, Marco Cannas, Franco Mario Gelardi, Simonpietro Agnello

Chemical and structural arrangement of the trigonal phase in GeSbTe thin films

Authors: 

Antonio M Mio, Stefania MS Privitera, Valeria Bragaglia, Fabrizio Arciprete, Corrado Bongiorno, Raffaella Calarco, Emanuele Rimini

Ti/Al ohmic contacts on AlGaN/GaN heterostructures with different defect density

Authors: 

Giuseppe Greco, Ferdinando Iucolano, Corrado Bongiorno, Filippo Giannazzo, Marcin Krysko, Mike Leszczynski, Fabrizio Roccaforte

Stress fields analysis in 3C–SiC free-standing microstructures by micro-Raman spectroscopy

Authors: 

N Piluso, R Anzalone, M Camarda, A Severino, G D'Arrigo, F La Via

Scanning probe microscopy on heterogeneous CaCu 3 Ti 4 O 12 thin films

Authors: 

Patrick Fiorenza, Raffaella Lo Nigro, Vito Raineri

Raman stress characterization of hetero-epitaxial 3C-SiC free standing structures

Authors: 

Nicolò Piluso, Massimo Camarda, Ruggero Anzalone, Andrea Severino, Antonino La Magna, Giuseppe D'Arrigo, Francesco La Via

Ab Initio Study of Ge Intercalation in Epitaxial Graphene on SiC (0001)

Authors: 

Ioannis Deretzis, Antonino La Magna

Compact instrumentation for radiation tolerance test of flash memories in space environment

Authors: 

Calogero Pace, Ernesto Della Sala, Giuseppe Capuano, Sebania Libertino, Isodiana Crupi, Antonio Marino, Salvatore Lombardo, Michael Lisiansky, Yakov Roizin

Electrical Properties of Inhomogeneous Pt/GaN Schottky Barrier

Authors: 

Fabrizio Roccaforte, Ferdinando Iucolano, Filippo Giannazzo, Salvatore Di Franco, Valeria Puglisi, Vito Raineri

Electrical and ultraviolet characterization of 4H-SiC Schottky photodiodes

Authors: 

G Lioliou, MC Mazzillo, A Sciuto, AM Barnett

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