Stress fields analysis in 3C–SiC free-standing microstructures by micro-Raman spectroscopy

Authors: 

N Piluso, R Anzalone, M Camarda, A Severino, G D'Arrigo, F La Via

Scanning probe microscopy on heterogeneous CaCu 3 Ti 4 O 12 thin films

Authors: 

Patrick Fiorenza, Raffaella Lo Nigro, Vito Raineri

Raman stress characterization of hetero-epitaxial 3C-SiC free standing structures

Authors: 

Nicolò Piluso, Massimo Camarda, Ruggero Anzalone, Andrea Severino, Antonino La Magna, Giuseppe D'Arrigo, Francesco La Via

Ab Initio Study of Ge Intercalation in Epitaxial Graphene on SiC (0001)

Authors: 

Ioannis Deretzis, Antonino La Magna

Compact instrumentation for radiation tolerance test of flash memories in space environment

Authors: 

Calogero Pace, Ernesto Della Sala, Giuseppe Capuano, Sebania Libertino, Isodiana Crupi, Antonio Marino, Salvatore Lombardo, Michael Lisiansky, Yakov Roizin

Electrical Properties of Inhomogeneous Pt/GaN Schottky Barrier

Authors: 

Fabrizio Roccaforte, Ferdinando Iucolano, Filippo Giannazzo, Salvatore Di Franco, Valeria Puglisi, Vito Raineri

Electrical and ultraviolet characterization of 4H-SiC Schottky photodiodes

Authors: 

G Lioliou, MC Mazzillo, A Sciuto, AM Barnett

Laser annealing of SiGe and Ge based devices

Authors: 

G Fisicaro, A La Magna, G Piccitto, V Privitera

Boron Diffusion and Electrical Activation in Pre-Amorphized Si Enriched with Fluorine

Authors: 

G Impellizzeri, S Mirabella, MG Grimaldi, F Priolo, F Giannazzo, V Raineri, E Napolitani, A Carnera

Evaluation of Mechanical and Optical Properties of Hetero-Epitaxial Single Crystal 3C-SiC Squared-Membrane

Authors: 

Ruggero Anzalone, Giuseppe D'Arrigo, Massimo Camarda, Nicolo’ Piluso, Francesco La Via

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