Scanning tip measurement for identification of point defects

Authors: 

László Dózsa, György Molnár, Vito Raineri, Filippo Giannazzo, János Ferencz, Štefan Lányi

Competition between uncatalyzed and catalyzed growth during the plasma synthesis of Si nanowires and its role on their optical properties

Authors: 

C Garozzo, A La Magna, G Mannino, V Privitera, S Scalese, PM Sberna, F Simone, RA Puglisi

Conductive Atomic Force Microscopy and Scanning Impedance Microscopy for the Imaging of Electrical Domain in CaCu 3 Ti 4 O 12 Perovskite Oxide

Authors: 

Raffaella Lo Nigro, Patrick Fiorenza, Vito Raineri

Role of Ion Irradiation Induced Lattice Defects on Nanoscale Capacitive Behavior of Graphene

Authors: 

Sushant Sonde, Filippo Giannazzo, Vito Raineri, Salvatore Di Franco, Antonio Marino, Emanuele Rimini

Temperature dependence of the c-axis drift mobility in 4H–SiC

Authors: 

G Galvagno, F Roccaforte, A Ruggiero, L Calcagno, E Zanetti, M Saggio, F Portuese, F La Via

Multiscale simulation for epitaxial silicon carbide growth by chlorides route

Authors: 

Maurizio Masi, Alessandro Fiorucci, Massimo Camarda, Antonino La Magna, Francesco La Via

A miniaturizable integrated Si-based light modulator

Authors: 

Antonella Sciuto, Sebania Libertino, Salvo Coffa, Giuseppe Coppola

Advantages of the FinFET architecture in SONOS and nanocrystal memory devices

Authors: 

S Lombardo, C Gerardi, L Breuil, C Jahan, L Perniola, G Cina, D Corso, E Tripiciano, V Ancarani, G Iannaccone, G Iacono, C Bongiorno, J Razafindramora, C Garozzo, P Barbera, E Nowak, R Puglisi, GA Costa, C Coccorese, M Vecchio, E Rimini, J Van Houdt, B De Salvo, M Melanotte

Near-and far-infrared absorption and electronic structure of Ge-SiGe multiple quantum wells

Authors: 

Y Busby, M De Seta, G Capellini, F Evangelisti, M Ortolani, MICHELE Virgilio, GIUSEPPE Grosso, G Pizzi, P Calvani, S Lupi, M Nardone, G Nicotra, C Spinella

Study of microstructure deflections and film/substrate curvature under generalized stress fields and mechanical properties

Authors: 

Massimo Camarda, Ruggero Anzalone, Antonino La Magna, Francesco La Via

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