Effects of temperature and humidity on electrospun conductive nanofibers based on polyaniline blends

Authors: 

E Zampetti, A Muzyczuk, A Macagnano, S Pantalei, S Scalese, C Spinella, A Bearzotti

Modeling of Atomic Migration Phenomena in Phase Change Memory Devices

Authors: 

G. D'Arrigo L. Crespi, A. Lacaita,M. Boniardi, E. Varesi, A. Ghetti and A. Redaelli

High performance SiC detectors for MeV ion beams generated by intense pulsed laser plasmas

Authors: 

M Cutroneo, P Musumeci, M Zimbone, L Torrisi, F La Via, D Margarone, A Velyhan, J Ullschmied, L Calcagno

Micro‐Raman analysis and finite‐element modeling of 3 C‐SiC microstructures

Authors: 

N Piluso, R Anzalone, M Camarda, A Severino, A La Magna, G D'Arrigo, F La Via

Breakdown kinetics at nanometer scale of innovative MOS devices by conductive atomic force microscopy

Authors: 

Patrick Fiorenza, Raffaella Lo Nigro, Vito Raineri, Dario Salinas

Atomic-Scale Analysis of Chemical Bonding of Delaminated Graphene at Faceted SiC by Aberration-Corrected Scanning Transmission Electron Microscopy

Authors: 

G Nicotra, QM Ramasse, I Deretzis, C Bongiorno, C Spinella, F Giannazzo

Solution processed pentacene thin films: new routes for building-up plastic field effect transistors

Authors: 

C Musumeci, D Spina, S Cataldo, A Scandurra, C Bongiorno, S Ravesi, B Pignataro

SENSING ELEMENT FOR GLUCOSE BIOSENSOR

Authors: 

M FICHERA, F GIANNAZZO, S LIBERTINO, F SINATRA

Use of radio frequency power, silicon tetrafluoride and methane as parameters to tune structural properties of hydrogenated microcrystalline silicon carbon alloys

Authors: 

S Gaiaschi, R Ruggeri, ME Gueunier-Farret, EV Johnson

Thermal stability of the current transport mechanisms in Ni-based Ohmic contacts on n-and p-implanted 4H-SiC

Authors: 

M Vivona, G Greco, F Giannazzo, R Lo Nigro, S Rascunà, M Saggio, F Roccaforte

Pages