Praseodymium Silicate as a High‐k Dielectric Candidate: An Insight into the Pr2O3‐Film/Si‐Substrate Interface Fabricated Through a Metal–Organic Chemical Vapor Deposition Process

Authors: 

Raffaella Lo Nigro, Roberta G Toro, Graziella Malandrino, Guglielmo G Condorelli, Vito Raineri, Ignazio L Fragalà

Integration of silicon nanocrystal memory arrays with HfAlOx based interpoly dielectric

Authors: 

G Molas, M Bocquet, J Buckley, H Grampeix, JP Colonna, L Masarotto, F Martin, M Gely, B De Salvo, S Deleonibus, DS Golubovic, MJ van Duuren, C Bongiorno, S Lombardo

Correlation between macroscopic and microscopic stress fields: Application to the 3C–SiC/Si heteroepitaxy

Authors: 

Massimo Camarda, Ruggero Anzalone, Andrea Severino, Nicolò Piluso, Andrea Canino, Francesco La Via, Antonino La Magna

Effects of the thermal annealing processes on praseodymium oxide based films grown on silicon substrates

Authors: 

Raffaella Lo Nigro, Roberta G Toro, Graziella Malandrino, Vito Raineri, Ignazio L Fragalà

Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage

Authors: 

D Corso, S Aurite, E Sciacca, D Naso, Salvatore Lombardo, A Santangelo, MC Nicotra, S Cascino

Reliability of thermally oxidized Si O 2∕ 4 H-Si C by conductive atomic force microscopy

Authors: 

Patrick Fiorenza, Vito Raineri

Irradiation damage in graphene on SiO 2 probed by local mobility measurements

Authors: 

F Giannazzo, S Sonde, V Raineri, E Rimini

Temperature stability of breakdown voltage on SiC power Schottky diodes with different barrier heights

Authors: 

R Pierobon, G Meneghesso, E Zanoni, Fabrizio Roccaforte, Francesco La Via, Vito Raineri

Stress evaluation on hetero-epitaxial 3C-SiC film on (100) Si substrates

Authors: 

Ruggero Anzalone, M Camarda, C Locke, J Carballo, N Piluso, G D'Arrigo, A Severino, AA Volinsky, SE Saddow, F La Via

Nanoscale Probing of Interfaces in GaN for Devices Applications

Authors: 

Filippo Giannazzo, Antonino Scuderi, Giuseppe Greco, Patrick Fiorenza, Raffaela Lo Nigro, Michal Leszczyński, Fabrizio Roccaforte

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