Insulator-metal transition in biased finite polyyne systems

Authors: 

Antonino La Magna, Ioannis Deretzis, Vittorio Privitera

On the viability of Au/3C-SiC Schottky barrier diodes

Authors: 

Jens Eriksson, Ming Hung Weng, Fabrizio Roccaforte, Filippo Giannazzo, Salvatore Di Franco, Stefano Leone, Vito Raineri

A look underneath the SiO2/4H-SiC interface after N2O thermal treatments

Authors: 

Patrick Fiorenza, Filippo Giannazzo, Lukas K Swanson, Alessia Frazzetto, Simona Lorenti, Mario S Alessandrino, Fabrizio Roccaforte

Role of the growth parameters on the structural order of MWCNTs produced by arc discharge in liquid nitrogen

Authors: 

Salvatore Bagiante, Silvia Scalese, Viviana Scuderi, Luisa D'Urso, Elena Messina, Giuseppe Compagnini, Vittorio Privitera

Nanoscale electro-structural characterisation of ohmic contacts formed on p-type implanted 4H-SiC

Authors: 

Alessia Frazzetto, Filippo Giannazzo, Raffaella Lo Nigro, Salvatore Di Franco, Corrado Bongiorno, Mario Saggio, Edoardo Zanetti, Vito Raineri, Fabrizio Roccaforte

Nanoscale Characterization of SiC Interfaces and Devices

Authors: 

Filippo Giannazzo, Patrick Fiorenza, Mario Saggio, Fabrizio Roccaforte

Void Formation in Differently Oriented Si in the Early Stage of SiC Growth

Authors: 

Andrea Severino, Corrado Bongiorno, Ruggero Anzalone, Giuseppe Abbondanza, Marco Mauceri, Giuseppe Condorelli, Gaetano Foti, Francesco La Via

Role of Ge nanoclusters in the performance of photodetectors compatible with Si technology

Authors: 

S Cosentino, S Mirabella, Pei Liu, Son T Le, M Miritello, S Lee, I Crupi, G Nicotra, C Spinella, D Paine, A Terrasi, A Zaslavsky, D Pacifici

Comparative study of the current transport mechanisms in Ni2Si Ohmic contacts on n-and p-type implanted 4H-SiC

Authors: 

Marilena Vivona, Giuseppe Greco, Salvatore di Franco, Filippo Giannazzo, Fabrizio Roccaforte, Alessia Frazzetto, Simone Rascunà, Edoardo Zanetti, Alfio Guarnera, Mario Saggio

MOCVD approach to perovskite based thin films: From high Tc superconductors to giant dielectric constant materials

Authors: 

G Malandrino, RG Toro, R Lo Nigro, IL Fragalà

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