M CONSALES, A CRESCITELLI, A CUTOLO, A CUSANO, S CAMPOPIANO, M PENZA, P AVERSA, M GIORDANO
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Origin: Sensors And Microsystems
K Bharuth-Ram, HP Gunnlaugsson, R Mantovan, VV Naicker, D Naidoo, R Sielemann, G Weyer, Th Aigne, ISOLDE Collaboration
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Origin: ICAME 2007
E Carlino, V Grillo, P Palazzari
Biblio references: Pages: 177-180
Origin: Microscopy of Semiconducting Materials 2007
F Siviero, N Coppedè, L Aversa, M Nardi, A Pallaoro, T Toccoli, R Verucchi, S Iannotta, AM Taurino, P Siciliano
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D Donisi, R Beccherelli, Antonio D'Alessandro, Luciano DE SIO, C Umeton, MA Caponero
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Origin: PROCEEDINGS OF THE SEVENTH IEEE CONFERENCE ON SENSORS-IEEE SENSORS 2008
Andrea Baschirotto, Enrico Melissano, Pietro Siciliano, Enrico Dallago, Piero Malcovati, Marco Marchesi, Giuseppe Venchi
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Camilla Baratto, Elisabetta Comini, M FERRONI, G FAGLIA, Alberto Vomiero, Giorgio Sberveglieri
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M Casalino, L Sirleto, L Moretti, F Della Corte, I Rendina
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