V Grillo, F Glas, E Carlino
Biblio references: Pages: 95-96
Origin: EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
G NERI, A BONAVITA, G RIZZO, S GALVAGNO, N PINNA, M NIEDERBERGER, S CAPONE, P SICILIANO
Biblio references: Pages: 236-241
Origin: Sensors And Microsystems
E Speiser, W Richter, P Prete, P Paiano, Nicola Lovergine
Biblio references: Pages: nd-nd
Origin: 22nd General Conference on the Condensed Matter Division of the European Physical Society (CMD-22)
W Vastarella, M ILIE, L NARDI, A MASCI, R PILLOTON, E Cianci, S QUARESIMA, A COPPA, V FOGLIETTI
Biblio references: Pages: 312-316
V Morandi, A Migliori, P Maccagnani, M Ferroni, F Tamarri
Biblio references: Pages: 581-582
Mario Medugno
Biblio references: Pages: 369-373
M Casalino, L Sirleto, L Moretti, F Della Corte, I Rendina
Biblio references: Pages: 448-457
E Carlino, V Grillo, P Palazzari
Biblio references: Pages: 177-180
Origin: Microscopy of Semiconducting Materials 2007
F Siviero, N Coppedè, L Aversa, M Nardi, A Pallaoro, T Toccoli, R Verucchi, S Iannotta, AM Taurino, P Siciliano
Biblio references: Pages: 257-261
D Donisi, R Beccherelli, Antonio D'Alessandro, Luciano DE SIO, C Umeton, MA Caponero
Biblio references:
Origin: PROCEEDINGS OF THE SEVENTH IEEE CONFERENCE ON SENSORS-IEEE SENSORS 2008
