LUCA DE STEFANO, LUCIA ROTIROTI, K MALECKI, IVO RENDINA, FG DELLA CORTE, LUIGI MORETTI
Biblio references: Pages: 450-456
Origin: Sensors And Microsystems
E Piscopiello, E Bonetti, E Callini, L Pasquini, M Vittori Antisari
Biblio references: Pages: 309-310
Origin: EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
M Canino, Anna Cavallini, A Poggi, R Nipoti
Biblio references: Volume: 19 Pages: 24-28
Origin: J Mater Sci: Mater Electr.
F Siviero, N Coppedè, L Aversa, M Nardi, A Pallaoro, T Toccoli, R Verucchi, S Iannotta, AM Taurino, P Siciliano
Biblio references: Pages: 257-261
Lucio Ciccarelli, Mario Medugno
Biblio references: Pages: 132-136
E Carlino, V Grillo, P Palazzari
Biblio references: Pages: 177-180
Origin: Microscopy of Semiconducting Materials 2007
Filippo Giannazzo, Patrick Fiorenza, Vito Raineri
Biblio references: Pages: 63-103
Origin: Applied Scanning Probe Methods X
S PANTALEI, E ZAMPETTI, A MACAGNANO, E PROIETTI, C DI NATALE, A D'AMICO
Biblio references: Pages: 239-244
F MANCARELLA, A RONCAGLIA, M PASSINI, GC CARDINALI, M SEVERI
Biblio references: Pages: 152-156
W Vastarella, M ILIE, L NARDI, A MASCI, R PILLOTON, E Cianci, S QUARESIMA, A COPPA, V FOGLIETTI
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