Filippo Giannazzo, Patrick Fiorenza, Vito Raineri
Biblio references: Pages: 63-103
Origin: Applied Scanning Probe Methods X
V Grillo, E Carlino, L Felisari, L Manna, L Carbone
Biblio references: Pages: 181-184
Origin: Microscopy of Semiconducting Materials 2007
W Vastarella, M ILIE, L NARDI, A MASCI, R PILLOTON, E Cianci, S QUARESIMA, A COPPA, V FOGLIETTI
Biblio references: Pages: 312-316
Origin: Sensors And Microsystems
M Canino, Anna Cavallini, A Poggi, R Nipoti
Biblio references: Volume: 19 Pages: 24-28
Origin: J Mater Sci: Mater Electr.
Andrea Adami, Leandro Lorenzelli, Vittorio Guarnieri, L FRANCIOSO, A TAURINO, P SICILIANO, G AGNUSDEI
Biblio references: Pages: 375-379
V Grillo, E Carlino
Biblio references: Pages: 165-168
F MANCARELLA, A RONCAGLIA, GC CARDINALI, G PIZZOCHERO, S GUERRI, M SEVERI
Biblio references: Pages: 573-577
E Piscopiello, E Bonetti, E Callini, L Pasquini, M Vittori Antisari
Biblio references: Pages: 309-310
Origin: EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
AG MIGNANI, AA MENCAGLIA, L CIACCHERI, R RELLA, J SPADAVECCHIA, R PAOLESSE, C DI NATALE, A D'AMICO
Biblio references: Pages: 407-412
and L. Vietzorreck S. Catoni, S. Di Nardo, P. Farinelli, F
Biblio references: Volume: 12 Pages: 49-58
Origin: Recent Developments in MEMS Technologies for Microwave and Millimeter Wave Circuits, Series in Micro and Nanoengineering