D Donisi, R Beccherelli, Antonio D'Alessandro, Luciano DE SIO, C Umeton, MA Caponero
Biblio references:
Origin: PROCEEDINGS OF THE SEVENTH IEEE CONFERENCE ON SENSORS-IEEE SENSORS 2008
Camilla Baratto, Elisabetta Comini, M FERRONI, G FAGLIA, Alberto Vomiero, Giorgio Sberveglieri
Biblio references: Pages: 162-171
Origin: Sensors And Microsystems
MG Manera, J Spadavecchia, R Rella, A Leone, D Dell'Atti, M Minunni, M Mascini
Biblio references: Pages: 209-216
F Siviero, N Coppedè, L Aversa, M Nardi, A Pallaoro, T Toccoli, R Verucchi, S Iannotta, AM Taurino, P Siciliano
Biblio references: Pages: 257-261
K Bharuth-Ram, HP Gunnlaugsson, R Mantovan, VV Naicker, D Naidoo, R Sielemann, G Weyer, Th Aigne, ISOLDE Collaboration
Biblio references: Pages: 621-625
Origin: ICAME 2007
ANDREA LUCIBELLO, EMANUELA PROIETTI, SIMONE CATONI, ROMOLO MARCELLI, LUCIANO FRENGUELLI, GIANCARLO BARTOLUCCI
Biblio references: Pages: 321-328
E Carlino, V Grillo, P Palazzari
Biblio references: Pages: 177-180
Origin: Microscopy of Semiconducting Materials 2007
L BISSI, P PLACIDI, M PICCIONI, M CICIONI, A SCORZONI, L ROSELLI, L MASINI, I ELMI, S ZAMPOLLI, GC CARDINALI
Biblio references: Pages: 669-674
E Piscopiello, E Bonetti, E Callini, L Pasquini, M Vittori Antisari
Biblio references: Pages: 309-310
Origin: EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
Antonella Lorusso, Vincenzo Nassisi, Paola Prete, Nicola Lovergine, L Velardi
Biblio references: Pages: 205-206
Origin: Atti XCIV Congr. Nazionale
