A RONCAGLIA, F MANCARELLA, GC CARDINALI, S CRISTIANI, M SANMARTIN, M SEVERI
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Origin: Sensors And Microsystems
S Capone, P Siciliano, AM Taurino, I Hotovy, V Rehacek
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Andrea Adami, Leandro Lorenzelli, Vittorio Guarnieri, L FRANCIOSO, A TAURINO, P SICILIANO, G AGNUSDEI
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DS PRESICCE, L FRANCIOSO, P SICILIANO, A ADAMI, L LORENZELLI, M MALFATTI, V GUARNIERI, M ZEN
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Marco Grassi, Piero Malcovati, Simonetta Capone, Luca Francioso, Pietro Siciliano, Andrea Baschirotto
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V Grillo, E Carlino
Biblio references: Pages: 165-168
Origin: Microscopy of Semiconducting Materials 2007
G Pettinari, F Masia, A Polimeni, M Felici, R Trotta, M Capizzi, T Niebling, H Günther, PJ Klar, W Stolz, A Lindsay, EP O'REILLY, M Piccin, G Bais, S Rubini, F Martelli, A Franciosi
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Origin: EPIOPTICS-9
D Donisi, R Beccherelli, Antonio D'Alessandro, Luciano DE SIO, C Umeton, MA Caponero
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Origin: PROCEEDINGS OF THE SEVENTH IEEE CONFERENCE ON SENSORS-IEEE SENSORS 2008
V Morandi, A Migliori, F Corticelli, M Ferroni
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Origin: EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
L DE STEFANO, L ROTIROTI, I REA, E DE TOMMASI, MA NIGRO, FG DELLA CORTE, I RENDINA
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