Anna Persano, Augusto Tazzoli, P Farinelli, Gaudenzio Meneghesso, Pietro Siciliano, Fabio Quaranta
Biblio references: Volume: 52 Issue: 9-10 Pages: 2245-2249
Origin: Microelectronics Reliability
MA Ferrara, L Sirleto
Biblio references: Volume: 21 Issue: 03 Pages: 1250039
Origin: Journal of Nonlinear Optical Physics & Materials
I Ricciardi, E De Tommasi, P Maddaloni, S Mosca, A Rocco, JJ Zondy, M De Rosa, P De Natale
Biblio references: Volume: 110 Issue: 17 Pages: 2103-2109
Origin: Molecular Physics
G Di Girolamo, M Alfano, L Pagnotta, A Taurino, J Zekonyte, RJK Wood
Biblio references: Volume: 21 Issue: 9 Pages: 1989-1997
Origin: Journal of materials engineering and performance
S D'Agostino, F Della Sala, LC Andreani
Biblio references: Volume: 1475 Issue: 1 Pages: 47-49
Origin: AIP Conference Proceedings
Roberto Jakomin, Antonella Parisini, Luciano Tarricone, Massimo Longo, Beatrice Fraboni, Salvatore Vantaggio
Biblio references: Volume: 520 Issue: 21 Pages: 6619-6625
Origin: Thin solid films
S Libertino, G Cannella, V Aiello, A Busacca, S Lombardo
Biblio references: Volume: 101 Issue: 9 Pages: 093703
Origin: Applied Physics Letters
Domenico Corso, Sebania Libertino, Michael Lisiansky, Yakov Roizin, Felix Palumbo, Fabio Principato, Calogero Pace, Paolo Finocchiaro, Salvatore A Lombardo
Biblio references: Volume: 59 Issue: 10 Pages: 2597-2602
Origin: IEEE transactions on electron devices
L Wen, M Stavola, WB Fowler, R Trotta, A Polimeni, M Capizzi, G Bisognin, M Berti, S Rubini, F Martelli
Biblio references: Volume: 86 Issue: 8 Pages: 085206
Origin: Physical Review B
P Luches, L Pasquini, S Benedetti, S Valeri, R Rüffer, F Boscherini
Biblio references: Volume: 101 Issue: 8 Pages: 082412
