2012 | IMM Container

Nanoscale mechanically induced structural and electrical changes in Ge2Sb2Te5 films

R Cecchini, José J Benítez, Juan Carlos Sánchez-López, A Fernández

2012-01-01

Biblio references: Volume: 111 Issue: 1 Pages: 016101

Origin: Journal of Applied Physics

Nuclear Instruments and Methods in Physics Research A

Y Abdou, KH Becker, J Berdermann, M Bissok, C Bohm, S Boser, M Bothe, M Carson, F Descamps, JH Fischer-Wolfarth, L Gustafsson, A Hallgren, D Heinen, K Helbing, R Heller, S Hundertmark, T Karg, K Krieger, K Laihem, T Meures, R Nahnhauer, U Naumann, F Oberson, L Paul, M Pohl, B Price, M Ribordy, D Ryckbosch, M Schunck, B Semburg, J Stegmaier, KH Sulanke, D Tosi, J Vandenbroucke, C Wiebusch

2012-01-01

Biblio references: Volume: 683 Pages: 78-90

Origin: Nuclear Instruments and Methods in Physics Research A

2-Butoxyethanol from cleaning products responsible for complaints in workplaces: a case study

R Rella, A Sturaro, A Vianello

2012-01-01

Biblio references: Volume: 14 Issue: 10 Pages: 2659-2662

Origin: Journal of Environmental Monitoring

Charge Transients by Variable Wavelength Optical Pulses in CdTe Nuclear Detectors

I Farella, A Cola, Marco Anni

2012-01-01

Biblio references: Pages: 4604-4610

Origin: IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD

Proceedings of the EMRS 2011 Spring Meeting Symposium D: Synthesis, Processing and Characterization of Nanoscale Multi Functional Oxide Films III Preface

Valentin Craciun, Maryline Guilloux-Viry, Mann Alexe, GC Bernabe, Marco Fanciulli

2012-01-01

Biblio references: Volume: 520 Issue: 14 Pages: 4507-4507

Origin: Thin Solid Films

Guided-wave liquid-crystal photonics

Dimitrios C Zografopoulos, Rita Asquini, Emmanouil E Kriezis, Antonio d'Alessandro, Romeo Beccherelli

2012-01-01

Biblio references: Volume: 12 Issue: 19 Pages: 3598-3610

Origin: Lab on a Chip

Microscopic origin of compressive strain in hydrogen-irradiated dilute GaAs 1-yN y alloys: Role of NH n centers with n> 2 and their thermal stability

Antonio POLIMENI, M Berti, M Stavola, Mario Capizzi, Silvia Rubini, Rinaldo Trotta, Faustino Martelli, L Wen, WB Fowler, G Bisognin

2012-01-01

Biblio references: Volume: 86 Issue: 8 Pages: 085206-1-085206-6

Origin: Physical Review B-Condensed Matter and Materials Physics

Reduction of short channel effects and hot carrier induced instability in fully self-aligned gate overlapped lightly doped drain polysilicon TFTs

Antonio Valletta, Luca Maiolo, Luigi Mariucci, Alessandro Pecora, Matteo Rapisarda, Guglielmo Fortunato, Stan D Brotherton

2012-01-01

Biblio references: Volume: 8 Issue: 1 Pages: 18-22

Origin: Journal of display Technology

Peer-reviewed journal articles

E Fazio, F Neri, S Savasta, S Spadaro S Trusso, F Caltagirone, U Ferrari, L Leuzzi, G Parisi, F Ricci-Tersenghi, T SUBJECTSPIN Rizzo

2012-01-01

Biblio references: Volume: 85 Pages: 195423-1

Origin: Physical review. B, Condensed matter and materials physics (Online)

Caracterisations structurales et electriques de μc-Si1− xCx: H deposes par RF-PECVD

Sofia Gaiaschi, R Ruggeri, EV Johnson, Pavel Bulkin, Marie-Estelle Gueunier-Farret, Christophe Longeaud, G Mannino, Jean-Paul Kleider

2012-01-01

Biblio references:

Origin: Actes des 2e Journées Nationales du PhotoVoltaïque 2012

Nanoscale mechanically induced structural and electrical changes in Ge2Sb2Te5 films

Nuclear Instruments and Methods in Physics Research A

2-Butoxyethanol from cleaning products responsible for complaints in workplaces: a case study

Charge Transients by Variable Wavelength Optical Pulses in CdTe Nuclear Detectors

Proceedings of the EMRS 2011 Spring Meeting Symposium D: Synthesis, Processing and Characterization of Nanoscale Multi Functional Oxide Films III Preface

Guided-wave liquid-crystal photonics

Microscopic origin of compressive strain in hydrogen-irradiated dilute GaAs 1-yN y alloys: Role of NH n centers with n> 2 and their thermal stability

Reduction of short channel effects and hot carrier induced instability in fully self-aligned gate overlapped lightly doped drain polysilicon TFTs

Peer-reviewed journal articles

Caracterisations structurales et electriques de μc-Si1− xCx: H deposes par RF-PECVD

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