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Terahertz Time-Domain Characterization of Thin Conducting Films in Reflection Mode

Dimitrios C Zografopoulos, Irnik Dionisiev, Nikolay Minev, Gaetana Petrone, Francesco Maita, Luca Maiolo, Dimitre Dimitrov, Vera Marinova, Andrea Liscio, Valentina Mussi, Romeo Beccherelli, Walter Fuscaldo

2024-10-23

Biblio references:

Origin: IEEE Transactions on Antennas and Propagation

Plasmon Response in Individual Conical Silicon Nanowires with Different Lengths

Rizwan Rafique, Antonino La Magna, Antonio Massimiliano Mio, Salvatore Patanè, Jost Adam, Rosaria Anna Puglisi

2024-10-23

Biblio references: Volume: 11 Issue: 11 Pages: 999

Origin: Photonics

A refined plan-view specimen preparation technique for high-quality electron microscopy studies of epitaxially grown atomically thin 2D layers

AS Prikhodko, E Zallo, R Calarco, NI Borgardt

2024-10-18

Biblio references: Pages: 114063

Origin: Ultramicroscopy

Eco-sustainable and flexible SERS platform based on waste cellulose decorated by Ag nanoparticles

D Giuffrida, D Spadaro, V Strano, S Trusso, ML Saladino, F Armetta, RC Ponterio

2024-10-17

Biblio references: Pages: 130061

Origin: Materials Chemistry and Physics

Intrinsic doping and ageing of indium oxide thin films

Andrea Lo Mastro, Fiorella Tringali, Maria Miritello, Giorgia Franzò, Antonio Terrasi

2024-10-15

Biblio references: Volume: 670 Pages: 160716

Origin: Applied Surface Science

Low-Temperature Sintering of Colloidal Gold Nanoparticles by Salt Addition

L Catanzaro, V Scardaci, M Scuderi, M Condorelli, L D’Urso, G Compagnini

2024-10-15

Biblio references: Pages: 1-6

Origin: Journal of Materials Engineering and Performance

Actively pulsed dual heating in vaporizing liquid microthrusters: an integrated analysis combining numerical simulations and experiments

Angelica Maria Toscano, Daan Kortleven, Donato Fontanarosa, Miriam Basile, Guido Marsiglia, Maria Grazia De Giorgi, Maria Rosaria Vetrano, Johan Steelant, Luca Francioso

2024-10-14

Biblio references:

Origin: 75th International Astronautical Congress (IAC)

Formation of Micrometer-Sized Textured Hexagonal Silicon Crystals via Nanoindentation

Mouad Bikerouin, Anna Marzegalli, Davide Spirito, Gerald JK Schaffar, Corrado Bongiorno, Fabrizio Rovaris, Mohamed Zaghloul, Agnieszka Anna Corley-Wiciak, Antonio M Mio, Leo Miglio, Verena Maier-Kiener, Giovanni Capellini, Emilio Scalise

2024-10-10

Biblio references:

Origin: arXiv preprint arXiv:2410.08372

TE-Polarized Bessel-Beam Launchers for Wireless Power Transfer at Millimeter Waves: Theory, Design, and Experimental Validation

Francesca Benassi, Edoardo Negri, Walter Fuscaldo, Giacomo Paolini, Francesco Maita, Paolo Burghignoli, Diego Masotti, Alessandro Galli, Alessandra Costanzo

2024-10-02

Biblio references:

Origin: IEEE Transactions on Microwave Theory and Techniques

Comparing post-deposition and post-metallization annealing treatments on Al2O3/GaN capacitors for different metal gates

Emanuela Schilirò, Giuseppe Greco, Patrick Fiorenza, Salvatore Ethan Panasci, Salvatore Di Franco, Yvon Cordier, Eric Frayssinet, Raffaella Lo Nigro, Filippo Giannazzo, Fabrizio Roccaforte

2024-10-01

Biblio references: Volume: 14 Issue: 10

Origin: AIP Advances

Terahertz Time-Domain Characterization of Thin Conducting Films in Reflection Mode

Plasmon Response in Individual Conical Silicon Nanowires with Different Lengths

A refined plan-view specimen preparation technique for high-quality electron microscopy studies of epitaxially grown atomically thin 2D layers

Eco-sustainable and flexible SERS platform based on waste cellulose decorated by Ag nanoparticles

Intrinsic doping and ageing of indium oxide thin films

Low-Temperature Sintering of Colloidal Gold Nanoparticles by Salt Addition

Actively pulsed dual heating in vaporizing liquid microthrusters: an integrated analysis combining numerical simulations and experiments

Formation of Micrometer-Sized Textured Hexagonal Silicon Crystals via Nanoindentation

TE-Polarized Bessel-Beam Launchers for Wireless Power Transfer at Millimeter Waves: Theory, Design, and Experimental Validation

Comparing post-deposition and post-metallization annealing treatments on Al2O3/GaN capacitors for different metal gates

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