2005 | IMM Container

Electron beam and mechanical lithographies as enabling factors for organic-based device fabrication

P Visconti, D Pisignano, A Della Torre, L Persano, G Maruccio, A Biasco, R Cingolani, R Rinaldi

2005-12-01

Biblio references: Volume: 25 Issue: 5-8 Pages: 848-852

Origin: Materials Science and Engineering: C

Electron spin-echo relaxation and envelope modulation of shallow phosphorus donors in silicon

Anna Ferretti, Marco Fanciulli, Alessandro Ponti, Arthur Schweiger

2005-12-01

Biblio references: Volume: 72 Issue: 23 Pages: 235201

Origin: Physical Review B

Test of scintillator readout with single photon avalanche photodiodes

P Finocchiaro, A Campisi, D Corso, L Cosentino, G Fallica, S Lombardo, M Mazzillo, F Musumeci, Alessandro Piazza, G Privitera, S Privitera, E Rimini, D Sanfilippo, E Sciacca, A Scordino, S Tudisco

2005-12-01

Biblio references: Volume: 52 Issue: 6 Pages: 3040-3046

Origin: IEEE transactions on nuclear science

Optical properties of tetrapod-shaped CdTe nanocrystals

Davide Tarì, Milena De Giorgi, Fabio Della Sala, Luigi Carbone, Roman Krahne, Liberato Manna, Roberto Cingolani, Stefan Kudera, Wolfgang J Parak

2005-11-28

Biblio references: Volume: 87 Issue: 22 Pages: 224101

Origin: Applied Physics Letters

Experimental evidences for two paths in the dissolution process of B clusters in crystalline Si

D De Salvador, E Napolitani, G Bisognin, A Carnera, E Bruno, S Mirabella, G Impellizzeri, F Priolo

2005-11-28

Biblio references: Volume: 87 Issue: 22 Pages: 221902

Origin: Applied Physics Letters

Sputter deposition of Pt nanoclusters and thin films on PEM fuel cell electrodes

M Alvisi, G Galtieri, L Giorgi, R Giorgi, E Serra, MA Signore

2005-11-21

Biblio references: Volume: 200 Issue: 5-6 Pages: 1325-1329

Origin: Surface and Coatings Technology

A low-cost distributed measurement system based on gas smart sensors for environmental monitoring

L Bissi, A Scorzoni, P Placidi, L Marrocchi, M Bennati, S Zampolli, L Masini, I Elmi, GC Cardinali

2005-11-21

Biblio references: Pages: 301-306

Origin: Proceedings of International Conference on Sensing Technology

Photonic devices based on preferential etching

Bob Bellini, Jean-François Larchanché, Jean-Pierre Vilcot, Didier Decoster, Romeo Beccherelli, Antonio d'Alessandro

2005-11-20

Biblio references: Volume: 44 Issue: 33 Pages: 7181-7186

Origin: Applied optics

Scaling of excitations in dimerized and frustrated spin-1 2 chains

Davide Controzzi, C Degli Esposti Boschi, Fabio Ortolani, S Pasini

2005-11-17

Biblio references: Volume: 72 Issue: 17 Pages: 172409

Origin: Physical Review B

Single-photon imaging at 20,000 frames∕ s

Franco Zappa, Simone Tisa, Sergio Cova, P Maccagnani, Roberto Saletti, Roberto Roncella

2005-11-15

Biblio references: Volume: 30 Issue: 22 Pages: 3024-3026

Origin: Optics letters

Electron beam and mechanical lithographies as enabling factors for organic-based device fabrication

Electron spin-echo relaxation and envelope modulation of shallow phosphorus donors in silicon

Test of scintillator readout with single photon avalanche photodiodes

Optical properties of tetrapod-shaped CdTe nanocrystals

Experimental evidences for two paths in the dissolution process of B clusters in crystalline Si

Sputter deposition of Pt nanoclusters and thin films on PEM fuel cell electrodes

A low-cost distributed measurement system based on gas smart sensors for environmental monitoring

Photonic devices based on preferential etching

Scaling of excitations in dimerized and frustrated spin-1 2 chains

Single-photon imaging at 20,000 frames∕ s

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