A Ruggiero, S Libertino, F Roccaforte, F La Via, L Calcagno
Biblio references: Volume: 82 Issue: 3 Pages: 543-547
Origin: Applied Physics A
Franco Zappa, Simone Tisa, Sergio Cova, Piera Maccagnani, Domenico Bonaccini Calia, Roberto Saletti, Roberto Roncella, Giovanni Bonanno, Massimiliano Belluso
Biblio references: Volume: 55 Issue: 1 Pages: 365-374
Origin: IEEE transactions on instrumentation and measurement
MARCO Fanciulli, OMAR Costa, SILVIA Baldovino, SIMONE Cocco, GABRIELE Seguini, ENRICO Prati, GIOVANNA Scarel
Biblio references: Volume: 220 Pages: 263
Origin: NATO Science Series
Giorgio Lulli, Eros Albertazzi, Simone Balboni, Luciano Colombo
Biblio references: Volume: 18 Issue: 6 Pages: 2077
Origin: Journal of Physics: Condensed Matter
F Giannazzo, V Raineri, E Bruno, S Mirabella, G Impellizzeri, F Priolo, E Napolitani
Biblio references: Volume: 24 Issue: 1 Pages: 468-472
Origin: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
GIOVANNA SCAREL, MARCO FANCIULLI
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Origin: Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices
SIMONE COCCO BALDOVINO, GABRIELE SEGUINI, ENRICO PRATI, GIOVANNA SCAREL
Biblio references: Pages: 263
F Giannazzo, V Raineri, S Mirabella, G Impellizzeri, F Priolo, M Fedele, R Mucciato
Biblio references: Volume: 24 Issue: 1 Pages: 370-374
E Napolitani, D De Salvador, M Pesce, A Carnera, S Mirabella, F Priolo
Biblio references: Volume: 24 Issue: 1 Pages: 394-398
G Impellizzeri, S Mirabella, E Bruno, F Priolo, E Napolitani, A Carnera
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