Antonela Dima, Francesco Della Corte, Maurizio Casalino, Ivo Rendina
Biblio references: Volume: 38 Issue: 4-5 Pages: 637-641
Origin: Microelectronics journal
E Bruno, S Mirabella, E Napolitani, F Giannazzo, V Raineri, F Priolo
Biblio references: Volume: 257 Issue: 1-2 Pages: 181-185
Origin: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
F Bergamini, M Bianconi, S Cristiani
Biblio references: Volume: 257 Issue: 1-2 Pages: 593-596
S Privitera, E Rimini, C Bongiorno, A Pirovano, R Bez
Biblio references: Volume: 257 Issue: 1-2 Pages: 352-354
M Malvestuto, M Pedio, S Nannarone, G Pavia, G Scarel, M Fanciulli, F Boscherini
Biblio references: Volume: 101 Issue: 7 Pages: 074104
Origin: Journal of applied physics
T Cesca, A Gasparotto, G Mattei, B Fraboni, F Boscherini, M Longo, L Tarricone
Biblio references: Volume: 257 Issue: 1-2 Pages: 332-335
Davide De Salvador, Enrico Napolitani, Salvatore Mirabella, Gabriele Bisognin, Giuliana Impellizzeri, Alberto Carnera, Francesco Priolo
Biblio references: Volume: 257 Issue: 1-2 Pages: 165-168
D D’Angelo, AM Piro, S Mirabella, C Bongiorno, L Romano, A Terrasi, MG Grimaldi
Biblio references: Volume: 257 Issue: 1-2 Pages: 270-274
Andrei Zenkevich, Yu Lebedinskii, G Scarel, Marco Fanciulli, Andrey Baturin, N Lubovin
Biblio references: Volume: 47 Issue: 4-5 Pages: 657-659
Origin: Microelectronics Reliability
F Iucolano, F Giannazzo, F Roccaforte, L Romano, MG Grimaldi, V Raineri
Biblio references: Volume: 257 Issue: 1-2 Pages: 336-339