2009 | IMM Container

Strain Evaluation in SiC MEMS Test Structures

Matteo Bosi, Giovanni Attolini, Bernard E Watts, Cesare Frigeri, Francesca Rossi, Antonella Poggi, Alberto Roncaglia, Fulvio Mancarella, Oscar Martinez, Vanesa Hortelano

2009-09-25

Biblio references: Volume: 25 Issue: 8 Pages: 1031

Origin: ECS Transactions

Improved TEM Sample Preparation by Low Energy FIB for Strain Analysis by Convergent Beam Electron Diffraction

Roberto Balboni, Gabriella Borionetti, Luigi Moiraghi, Giuseppe Vaccari, Maria Luisa Polignano, Gian Pietro Carnevale, Francesco Cazzaniga, Isabella Mica, Francesca Sammiceli

2009-09-25

Biblio references: Volume: 25 Issue: 3 Pages: 385-396

Origin: ECS Transactions

Transition Metal Binary Oxides for ReRAM Applications

Sabina Spiga, Alessio Lamperti, Elena Cianci, Flavio G Volpe, Marco Fanciulli

2009-09-25

Biblio references: Volume: 25 Issue: 6 Pages: 411

Origin: ECS Transactions

MOCVD of complex oxide systems: from precursor chemistry to applications

Graziella Malandrino, Roberta G Toro, Raffaella Lo Nigro, Ignazio L Fragalà

2009-09-25

Biblio references: Volume: 25 Issue: 8 Pages: 125

Origin: ECS Transactions

Comparison of electrical measurements with structural analysis of thin high-k hafnium-based films

Emmanouel Hourdakis, M Theodoropoulou, Androula G Nassiopoulou, Andrea Parisini, Michael A Reading, Jaap Van den Berg, Thierry Conard, Stefan Degendt

2009-09-25

Biblio references: Volume: 25 Issue: 3 Pages: 363

Origin: ECS Transactions

High Depth Resolution Depth Profile Analysis of Ultra Thin High-κ Hf Based Films using MEIS Compared with XTEM, XRF, SE and XPS

Jaap Van den Berg, Michael A Reading, Andrea Parisini, Michael Kolbe, Burkhard Beckhoff, Spyros Ladas, Miklos Fried, Peter Petrik, Paul Bailey, Tim Noakes, Thierry Conard, Stefan De Gendt

2009-09-25

Biblio references: Volume: 25 Issue: 3 Pages: 349

Origin: ECS Transactions

CaCu3Ti4O12 Thin Films for Capacitive Applications: MOCVD Synthesis and Nanoscopic/Microscopic Characterization

Raffaella Lo Nigro, Roberta G Toro, Maria Rita Catalano, Graziella Malandrino, Ignazio L Fragalà, Patrick Fiorenza, Vito Raineri

2009-09-25

Biblio references: Volume: 25 Issue: 8 Pages: 135

Origin: ECS Transactions

Thermally induced permittivity enhancement in La-doped ZrO 2 grown by atomic layer deposition on Ge (100)

L Lamagna, C Wiemer, S Baldovino, A Molle, M Perego, Sylvie Schamm-Chardon, Pierre-Eugène Coulon, M Fanciulli

2009-09-21

Biblio references: Volume: 95 Issue: 12 Pages: 122902

Origin: Applied Physics Letters

Spin-orbit coupling and phase-coherent transport in InN nanowires

G Petersen, S Estévez Hernández, R Calarco, N Demarina, Th Schäpers

2009-09-18

Biblio references: Volume: 80 Issue: 12 Pages: 125321

Origin: Physical Review B

Theoretical and experimental investigation of radiative decay rates in active slot waveguides

C Creatore, LC Andreani, M Galli, M Miritello, R Lo Savio, F Priolo

2009-09-16

Biblio references: Volume: 11 Issue: 11 Pages: 114011

Origin: Journal of Optics A: Pure and Applied Optics

Strain Evaluation in SiC MEMS Test Structures

Improved TEM Sample Preparation by Low Energy FIB for Strain Analysis by Convergent Beam Electron Diffraction

Transition Metal Binary Oxides for ReRAM Applications

MOCVD of complex oxide systems: from precursor chemistry to applications

Comparison of electrical measurements with structural analysis of thin high-k hafnium-based films

High Depth Resolution Depth Profile Analysis of Ultra Thin High-κ Hf Based Films using MEIS Compared with XTEM, XRF, SE and XPS

CaCu3Ti4O12 Thin Films for Capacitive Applications: MOCVD Synthesis and Nanoscopic/Microscopic Characterization

Thermally induced permittivity enhancement in La-doped ZrO 2 grown by atomic layer deposition on Ge (100)

Spin-orbit coupling and phase-coherent transport in InN nanowires

Theoretical and experimental investigation of radiative decay rates in active slot waveguides

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