Sebania Libertino, D Corso, G Murè, A Marino, Felix Palumbo, F Principato, G Cannella, T Schillaci, S Giarusso, F Celi, M Lisiansky, Y Roizin, Salvatore Lombardo
Biblio references: Volume: 50 Issue: 9-11 Pages: 1857-1860
Origin: Microelectronics Reliability