Annamaria Buonomano, Francesco Calise, Massimo Dentice d’Accadia, Gabriele Ferruzzi, Sabrina Frascogna, Adolfo Palombo, Roberto Russo, Marco Scarpellino
Biblio references: Volume: 109 Pages: 19-39
Origin: Energy Conversion and Management
V Scuderi, G Amiard, S Boninelli, S Scalese, M Miritello, PM Sberna, G Impellizzeri, V Privitera
Biblio references: Volume: 42 Pages: 89-93
Origin: Materials Science in Semiconductor Processing
Marco Cucurachi, Luciano Velardi, Giambattista Lobreglio
Biblio references: Volume: 29 Issue: 1 Pages: 47-49
Origin: Rev Esp Quimioter
Enrica Arcadipane, Ruy Sanz, Maria Miritello, Giuliana Impellizzeri, Maria Grazia Grimaldi, Vittorio Privitera, Lucia Romano
Biblio references: Volume: 42 Pages: 24-27
Antonio Politano, Gennaro Chiarello
Biblio references: Volume: 8 Issue: 4 Pages: 713-718
Origin: ChemCatChem
Gino Giusi, O Giordano, Graziella Scandurra, S Calvi, G Fortunato, M Rapisarda, L Mariucci, Carmine Ciofi
Biblio references: Volume: 63 Issue: 3 Pages: 1239-1245
Origin: IEEE Transactions on Electron Devices
Ashu Kumar Bansal, Francesco Antolini, Shuyue Zhang, Lenuta Stroea, Luca Ortolani, Massimiliano Lanzi, Emanuele Serra, Sybille Allard, Ullrich Scherf, Ifor David William Samuel
Biblio references: Volume: 120 Issue: 3 Pages: 1871-1880
Origin: The Journal of Physical Chemistry C
D De Salvador, A Carnera, E Napolitani, G Impellizzeri, V Privitera, D Piccinotti, A La Magna, G Fortunato, A Portavoce, D Mangelinck
Biblio references: Volume: 119 Issue: 4
Origin: Journal of Applied Physics
R Milazzo, G Impellizzeri, D Piccinotti, A La Magna, G Fortunato, D De Salvador, A Carnera, A Portavoce, Dominique Mangelinck, V Privitera, E Napolitani
Biblio references: Volume: 119 Issue: 4 Pages: 045702
Francesca Telesio, Luca Pellegrino, Ilaria Pallecchi, Daniele Marré, Emanuela Esposito, Emiliano di Gennaro, Amit Khare, Fabio Miletto Granozio
Biblio references: Volume: 34 Issue: 1 Pages: 011208
Origin: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
