2008 | IMM Container

M Godlewski, E Guziewicz, J Szade, A Wójcik-Głodowska, T Krajewski, K Kopalko, R Jakieła, S Yatsunenko, E Przeździecka, P Kruszewski, N Huby, G Tallarida, S Ferrari

2008-12-01

Biblio references: Volume: 85 Issue: 12 Pages: 2434-2438

Origin: Microelectronic Engineering

New selector based on zinc oxide grown by low temperature atomic layer deposition for vertically stacked non-volatile memory devices

N Huby, G Tallarida, M Kutrzeba, S Ferrari, E Guziewicz, M Godlewski

2008-12-01

Biblio references: Volume: 85 Issue: 12 Pages: 2442-2444

Origin: Microelectronic Engineering

Integration of organic based Schottky junctions into crossbar arrays by standard UV lithography

E Katsia, G Tallarida, B Kutrzeba-Kotowska, S Ferrari, E Bundgaard, R Sondergaard, FC Krebs

2008-12-01

Biblio references: Volume: 9 Issue: 6 Pages: 1044-1050

Origin: ORGANIC ELECTRONICS

Influence of the Convergence and Stepover Angles in the Structural Style of Strike-Slip Systems: Analogue Models

D Gonzalez, L Pinto

2008-12-01

Biblio references: Volume: 2008 Pages: T23B-2013

Origin: AGU Fall Meeting Abstracts

Surface modification of carbon nanotube networked films with Au nanoclusters for enhanced NO2 gas sensing applications

The role of the amorphous phase in the re-crystallization process of cold-crystallized poly (ethylene terephthalate)

Experimental characterization and numerical analysis of the 4H-SiC p–i–n diodes static and transient behaviour

Integration of organic based Schottky junctions for crossbar non-volatile memory applications

Hydrogen gas sensing performance of Pt/SnO2 nanowires/SiC MOS devices

Study of the interfaces in resistive switching NiO thin films deposited by both ALD and e-beam coupled with different electrodes (Si, Ni, Pt, W, TiN)

Vertically stacked non-volatile memory devices–material considerations

New selector based on zinc oxide grown by low temperature atomic layer deposition for vertically stacked non-volatile memory devices

Integration of organic based Schottky junctions into crossbar arrays by standard UV lithography

Influence of the Convergence and Stepover Angles in the Structural Style of Strike-Slip Systems: Analogue Models

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Units in Italy

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