2008 | IMM Container

Influence of the Convergence and Stepover Angles in the Structural Style of Strike-Slip Systems: Analogue Models

D Gonzalez, L Pinto

2008-12-01

Biblio references: Volume: 2008 Pages: T23B-2013

Origin: AGU Fall Meeting Abstracts

Integration of organic based Schottky junctions for crossbar non-volatile memory applications

E Katsia, G Tallarida, B Kutrzeba-Kotowska, S Ferrari, E Bundgaard, R Sondergaard, FC Krebs

2008-12-01

Biblio references: Volume: 85 Issue: 12 Pages: 2439-2441

Origin: Microelectronics engineering

Beneficial effects of autologous bone marrow cell infusion and antioxidants/L-arginine in patients with chronic critical limb ischemia

Claudio Napoli, Bartolomeo Farzati, Vincenzo Sica, Emanuele Iannuzzi, Giuseppe Coppola, Andrea Silvestroni, Maria Luisa Balestrieri, Anna Florio, Angelo Matarazzo

2008-12-01

Biblio references: Volume: 15 Issue: 6 Pages: 709-718

Origin: European Journal of Cardiovascular Prevention & Rehabilitation

Study of the interfaces in resistive switching NiO thin films deposited by both ALD and e-beam coupled with different electrodes (Si, Ni, Pt, W, TiN)

A Lamperti, S Spiga, HL Lu, C Wiemer, M Perego, E Cianci, M Alia, M Fanciulli

2008-12-01

Biblio references: Volume: 85 Issue: 12 Pages: 2425-2429

Origin: Microelectronic Engineering

Vertically stacked non-volatile memory devices–material considerations

M Godlewski, E Guziewicz, J Szade, A Wójcik-Głodowska, T Krajewski, K Kopalko, R Jakieła, S Yatsunenko, E Przeździecka, P Kruszewski, N Huby, G Tallarida, S Ferrari

2008-12-01

Biblio references: Volume: 85 Issue: 12 Pages: 2434-2438

Origin: Microelectronic Engineering

New selector based on zinc oxide grown by low temperature atomic layer deposition for vertically stacked non-volatile memory devices

N Huby, G Tallarida, M Kutrzeba, S Ferrari, E Guziewicz, M Godlewski

2008-12-01

Biblio references: Volume: 85 Issue: 12 Pages: 2442-2444

Origin: Microelectronic Engineering

Infrared spectroscopy and X-ray diffraction studies on the crystallographic evolution of La2O3 films upon annealing

D Tsoutsou, G Scarel, A Debernardi, SC Capelli, SN Volkos, L Lamagna, S Schamm, Pierre-Eugène Coulon, M Fanciulli

2008-12-01

Biblio references: Volume: 85 Issue: 12 Pages: 2411-2413

Origin: Microelectronic Engineering

Integration of organic based Schottky junctions into crossbar arrays by standard UV lithography

E Katsia, G Tallarida, B Kutrzeba-Kotowska, S Ferrari, E Bundgaard, R Sondergaard, FC Krebs

2008-12-01

Biblio references: Volume: 9 Issue: 6 Pages: 1044-1050

Origin: ORGANIC ELECTRONICS

Thin MnO and NiO films grown using atomic layer deposition from ethylcyclopentadienyl type of precursors

HL Lu, G Scarel, XL Li, M Fanciulli

2008-12-01

Biblio references: Volume: 310 Issue: 24 Pages: 5464-5468

Origin: Journal of Crystal Growth

Dispersion and damping of gold surface plasmon

A Politano, V Formoso, G Chiarello

2008-12-01

Biblio references: Volume: 3 Issue: 4 Pages: 165

Origin: Plasmonics

Influence of the Convergence and Stepover Angles in the Structural Style of Strike-Slip Systems: Analogue Models

Integration of organic based Schottky junctions for crossbar non-volatile memory applications

Beneficial effects of autologous bone marrow cell infusion and antioxidants/L-arginine in patients with chronic critical limb ischemia

Study of the interfaces in resistive switching NiO thin films deposited by both ALD and e-beam coupled with different electrodes (Si, Ni, Pt, W, TiN)

Vertically stacked non-volatile memory devices–material considerations

New selector based on zinc oxide grown by low temperature atomic layer deposition for vertically stacked non-volatile memory devices

Infrared spectroscopy and X-ray diffraction studies on the crystallographic evolution of La2O3 films upon annealing

Integration of organic based Schottky junctions into crossbar arrays by standard UV lithography

Thin MnO and NiO films grown using atomic layer deposition from ethylcyclopentadienyl type of precursors

Dispersion and damping of gold surface plasmon

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Scientific Productions

Units in Italy

Contact info

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