F Giannazzo, F Roccaforte, F Iucolano, V Raineri, F Ruffino, MG Grimaldi
Biblio references: Volume: 27 Issue: 2 Pages: 789-794
Origin: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
XL Li, D Tsoutsou, G Scarel, C Wiemer, SC Capelli, SN Volkos, L Lamagna, M Fanciulli
Biblio references: Volume: 27 Issue: 2 Pages: L1-L7
Origin: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
Marco Messina, Francesco Franze, NicolÒ Speciale, Enrico Cozzani, Alberto Roncaglia
Biblio references: Volume: 9 Issue: 5 Pages: 504-511
Origin: IEEE Sensors Journal
Josep Carreras, O Jambois, S Lombardo, B Garrido
Biblio references: Volume: 20 Issue: 15 Pages: 155201
Origin: Nanotechnology
P Maddaloni, M Paturzo, P Ferraro, P Malara, P De Natale, M Gioffrè, G Coppola, M Iodice
Biblio references: Volume: 94 Issue: 12 Pages: 121105
Origin: Applied Physics Letters
P Vavassori, M Gobbi, M Donolato, V Metlushko, B Ilic, M Cantoni, D Petti, S Brivio, R Bertacco
Biblio references:
Origin: arXiv preprint arXiv:0903.3516
Antonio Qualtieri, Giovanni Morello, Piernicola Spinicelli, Maria T Todaro, Tiziana Stomeo, Luigi Martiradonna, Milena De Giorgi, Xavier Quélin, Stéphanie Buil, Alberto Bramati, Jean P Hermier, Roberto Cingolani, Massimo De Vittorio
Biblio references: Volume: 11 Issue: 3 Pages: 033025
Origin: New Journal of Physics
Origin: arXiv preprint arXiv:0903.3542
F Mezzadri, G Calestani, M Calicchio, E Gilioli, F Bolzoni, R Cabassi, M Marezio, A Migliori
Biblio references: Volume: 79 Issue: 10 Pages: 100106
Origin: Physical Review B
Zhenggang Lan, Eduardo Fabiano, Walter Thiel
Biblio references: Volume: 113 Issue: 11 Pages: 3548-3555
Origin: The Journal of Physical Chemistry B
