F Bergamini, M Bianconi, S Cristiani
Biblio references: Volume: 257 Issue: 1-2 Pages: 593-596
Origin: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
M Malvestuto, M Pedio, S Nannarone, G Pavia, G Scarel, M Fanciulli, F Boscherini
Biblio references: Volume: 101 Issue: 7 Pages: 074104
Origin: Journal of applied physics
Alessia Irrera, G Franzo, F Iacona, A Canino, G Di Stefano, D Sanfilippo, A Piana, PG Fallica, F Priolo
Biblio references: Volume: 38 Issue: 1-2 Pages: 181-187
Origin: Physica E: Low-dimensional Systems and Nanostructures
F Iucolano, F Giannazzo, F Roccaforte, L Romano, MG Grimaldi, V Raineri
Biblio references: Volume: 257 Issue: 1-2 Pages: 336-339
F Ruffino, R De Bastiani, MG Grimaldi, C Bongiorno, F Giannazzo, F Roccaforte, C Spinella, V Raineri
Biblio references: Volume: 257 Issue: 1-2 Pages: 810-814
E Bruno, S Mirabella, E Napolitani, F Giannazzo, V Raineri, F Priolo
Biblio references: Volume: 257 Issue: 1-2 Pages: 181-185
M Passacantando, L Ottaviano, V Grossi, A Verna, F D’Orazio, F Lucari, G Impellizzeri, F Priolo
Biblio references: Volume: 257 Issue: 1-2 Pages: 365-368
L Calcagno, A Ruggiero, P Musumeci, G Cuttone, F La Via, G Foti
Biblio references: Volume: 257 Issue: 1-2 Pages: 279-282
R De Bastiani, AM Piro, MG Grimaldi, E Rimini
Biblio references: Volume: 257 Issue: 1-2 Pages: 572-576
D Corso, S Aurite, E Sciacca, D Naso, Salvatore Lombardo, A Santangelo, MC Nicotra, S Cascino
Biblio references: Volume: 47 Issue: 4-5 Pages: 806-809
Origin: Microelectronics Reliability