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Surname: 
Sapienza
Firstname: 
Sergio
Position: 
Temporary
Profile: 
Researcher
Curriculum (PDF): 
PDF icon CV_Sergio_Sapienza_ENG_07022020_mod.pdf
Source: 
Bologna UNIT

Scientific Productions

Viviana Scuderi, Annamaria Muoio, A Garofalo, Sergio Sapienza, Matteo Ferri, Luca Belsito, Alberto Roncaglia, Francesco La Via

Stress Fields Distribution and Simulation in 3C-SiC (111) Resonators

Scientific Books of Abstracts [Trans Tech Publications Ltd], Volume: 8 Pages: 703-705

Viviana Scuderi, Annamaria Muoio, Sergio Sapienza, Matteo Ferri, Luca Belsito, Alberto Roncaglia, Francesco La Via

Stress Fields Distribution and Simulation in 3C-SiC Resonators

Key Engineering Materials [Trans Tech Publications Ltd], Volume: 984 Pages: 41-45

Sergio Sapienza, Luca Belsito, Matteo Ferri, Ivan Elmi, Marcin Zielinski, Francesco La Via, Alberto Roncaglia

Fabrication of Wafer-Level Vacuum-Packaged 3C-SiC Resonant Microstructures Grown on< 111> and< 100> Silicon

Key Engineering Materials [Trans Tech Publications Ltd], Volume: 984 Pages: 29-33

Giovanna Sozzi, Sergio Sapienza, Giovanni Chiorboli, Lasse Vines, Anders Hallén, Roberta Nipoti

Carrier lifetime dependence on temperature and proton irradiation in 4H-SiC device: an experimental law

IEEE Access [IEEE],

Sergio Sapienza, Luca Belsito, Matteo Ferri, Ivan Elmi, Marcin Zielinski, Francesco La Via, Alberto Roncaglia

Fabrication of Wafer-Level Vacuum-Packaged 3C-SiC Resonators with Q-Factor above 250,000

Proceedings [MDPI], Volume: 97 Issue: 1 Pages: 44

Sergio Sapienza, Matteo Ferri, Luca Belsito, Diego Marini, Marcin Zielinski, Francesco La Via, Alberto Roncaglia

Correlation between Q-Factor and Residual Stress in Epitaxial 3C-SiC Double-Clamped Beam Resonators

Materials Science Forum [Trans Tech Publications Ltd], Volume: 1089 Pages: 57-61

Sergio Sapienza, Matteo Ferri, Luca Belsito, Diego Marini, Marcin Zielinski, Francesco La Via, Alberto Roncaglia

Measurement of Residual Stress and Young’s Modulus on Micromachined Monocrystalline 3C-SiC Layers Grown on< 111> and< 100> Silicon

Micromachines [Multidisciplinary Digital Publishing Institute], Volume: 12 Issue: 9 Pages: 1072

Giovanna Sozzi, Sergio Sapienza, Roberta Nipoti, Giovanni Chiorboli

OCVD Measurement of Ambipolar and Minority Carrier Lifetime in 4H-SiC Devices: Relevance of the Measurement Setup

IEEE Transactions on Electron Devices [IEEE],

M Simonazzi, G Chiorboli, P Cova, R Menozzi, D Santoro, S Sapienza, C Sciancalepore, G Sozzi, N Delmonte

Smart soiling sensor for PV modules

Microelectronics Reliability [Pergamon], Volume: 114 Pages: 113789

S Sapienza, G Sozzi, D Santoro, P Cova, N Delmonte, G Verrini, G Chiorboli

Correlation between OCVD carrier lifetime vs temperature measurements and reverse recovery behavior of the body diode of SiC power MOSFETs

Microelectronics Reliability [Pergamon], Volume: 113 Pages: 113937

Francesco La Via, Luca Belsito, Ferri Matteo, Sergio Sapienza, Alberto Roncaglia, Marcin Zielinski, Viviana Scuderi

Residual Stress Measurement by Raman on Surface-Micromachined Monocrystalline 3C-SiC on Silicon on insulator

Materials Science Forum [Trans Tech Publications Ltd], Volume: 1062 Pages: 320-324

Roberta Nipoti, Maria Concetta Canino, Sergio Sapienza, Michele Bellettato, Giovanna Sozzi, Giovanni Alfieri

Activation Energy for the Post Implantation Annealing of 1019 cm-3 and 1020 cm-3 Ion Implanted Al in 4H SiC

Materials Science Forum [Trans Tech Publications Ltd], Volume: 963 Pages: 416-419

Danilo Santoro, Nicholas Rocchi, Sergio Sapienza, Marco Simonazzi, Giovanna Sozzi, Paolo Cova, Giovanni Chiorboli, Roberto Menozzi, Nicola Delmonte, Guilly Romain

Development of a PV modules soiling monitoring system for smart maintenance

Proceedings XXXIV Conference on Design of Circuits and Integrated Systems-DCIS 2019 [University of the Basque Country], Pages: 330-335

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